Title: Ghost imaging second harmonic generation microscopy

Abstract

Second harmonic generation (SHG) microscopy is useful for visualizing interfaces and sub-structures within a wide range of materials due to the propensity for SHG to occur in non-centrosymmetric environments. However, since SHG is a nonlinear process generally necessitating small focal sizes for higher peak powers, a raster scanning approach is usually needed to build an SHG image over a significant sample size. While raster scanning is effective, there is a cost in terms of the time needed to acquire the image and, also, some materials cannot withstand the higher optical intensities within the small focal volume. As such, we describe a SHG microscopy approach based on ghost imaging (GI), which enables imaging data to be collected in parallel rather than sequentially as in raster scanning techniques. We experimentally demonstrate the approach and combine GI-SHG with compressive sensing to make further substantial gains in reducing the amount of sampling required for image reconstruction. Furthermore, GI-SHG is shown to have significant advantages for imaging in highly scattering environments, partly because GI is a background-free approach requiring spatial correlations between photons that travel two paths, with one path entirely devoid of sample interaction. This basic property of GI means that only the photonsmore » that travel unimpeded through the sample preserve the spatial correlations needed to reconstruct the image, while more scattered photons do not contribute to the overall GI signal. Finally, we compare the image quality and sampling properties of three different reconstruction algorithms used for compressive sensing.« less

Authors:

Wen, Xiewen ^[1]; Adhikari, Sushovit ^[1]; Cortes, Cristian L. ^[1]; Gosztola, David J.  ^[1];

• Search DOE PAGES for author "Gosztola, David J."
• Search DOE PAGES for ORCID "0000-0003-2674-1379"

Gray, Stephen K.  ^[1];

• Search DOE PAGES for author "Gray, Stephen K."
• Search DOE PAGES for ORCID "0000-0002-5188-354X"

Wiederrecht, Gary P.  ^[1]

• Search DOE PAGES for author "Wiederrecht, Gary P."
• Search DOE PAGES for ORCID "0000-0001-8821-932X"

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+ Show Author Affiliations

1. Argonne National Lab. (ANL), Lemont, IL (United States)

Publication Date:

Mon May 11 00:00:00 EDT 2020

Research Org.:

Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Org.:

USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:

1632308

Alternate Identifier(s):

OSTI ID: 1617983

Grant/Contract Number:  

AC02-06CH11357

Resource Type:

Accepted Manuscript

Journal Name:

Applied Physics Letters

Additional Journal Information:

Journal Volume: 116; Journal Issue: 19; Journal ID: ISSN 0003-6951

Publisher:

American Institute of Physics (AIP)

Country of Publication:

United States

Language:

English

Subject:

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