Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach
Abstract
Laue micro-diffraction has proven to be able to reveal material properties at the sub-grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three-dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused-beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X-ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ~0.01°. Finally, the proposed method is fast to implement and does not require the use of additional surface markers.
- Authors:
-
[2];
- Tsinghua Univ., Beijing (China)
- Technical Univ. of Denmark, Lyngby (Denmark)
- Chongqing Univ. (China)
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC); National Natural Science Foundation of China (NSFC); European Union - Horizon 2020 Research and Innovation Programme
- OSTI Identifier:
- 1609123
- Grant/Contract Number:
- AC02-06CH11357; 51671113; 51471095; 788567
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Crystallography (Online)
- Additional Journal Information:
- Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 52; Journal Issue: 5; Journal ID: ISSN 1600-5767
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; DAXM; X-ray micro-diffraction; differential aperture X-ray microscopy; digital image correlation; in situ deformation; sample alignment
Citation Formats
Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, and Godfrey, Andrew. Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach. United States: N. p., 2019.
Web. doi:10.1107/S1600576719010562.
Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, & Godfrey, Andrew. Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach. United States. https://doi.org/10.1107/S1600576719010562
Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, and Godfrey, Andrew. Fri .
"Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach". United States. https://doi.org/10.1107/S1600576719010562. https://www.osti.gov/servlets/purl/1609123.
@article{osti_1609123,
title = {Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach},
author = {Zhang, Chenglu and Zhang, Yubin and Wu, Guilin and Liu, Wenjun and Xu, Ruqing and Juul Jensen, Dorte and Godfrey, Andrew},
abstractNote = {Laue micro-diffraction has proven to be able to reveal material properties at the sub-grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three-dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused-beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X-ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ~0.01°. Finally, the proposed method is fast to implement and does not require the use of additional surface markers.},
doi = {10.1107/S1600576719010562},
journal = {Journal of Applied Crystallography (Online)},
number = 5,
volume = 52,
place = {United States},
year = {2019},
month = {9}
}
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