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Title: Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach

Abstract

Laue micro-diffraction has proven to be able to reveal material properties at the sub-grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three-dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused-beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X-ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ~0.01°. Finally, the proposed method is fast to implement and does not require the use of additional surface markers.

Authors:
 [1]; ORCiD logo [2];  [3];  [4];  [4];  [2];  [1]
  1. Tsinghua Univ., Beijing (China)
  2. Technical Univ. of Denmark, Lyngby (Denmark)
  3. Chongqing Univ. (China)
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Natural Science Foundation of China (NNSFC); European Union - Horizon 2020 Research and Innovation Programme
OSTI Identifier:
1609123
Grant/Contract Number:  
AC02-06CH11357; 51671113; 51471095; 788567
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 52; Journal Issue: 5; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; DAXM; X-ray micro-diffraction; differential aperture X-ray microscopy; digital image correlation; in situ deformation; sample alignment

Citation Formats

Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, and Godfrey, Andrew. Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach. United States: N. p., 2019. Web. https://doi.org/10.1107/S1600576719010562.
Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, & Godfrey, Andrew. Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach. United States. https://doi.org/10.1107/S1600576719010562
Zhang, Chenglu, Zhang, Yubin, Wu, Guilin, Liu, Wenjun, Xu, Ruqing, Juul Jensen, Dorte, and Godfrey, Andrew. Fri . "Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach". United States. https://doi.org/10.1107/S1600576719010562. https://www.osti.gov/servlets/purl/1609123.
@article{osti_1609123,
title = {Alignment of sample position and rotation during in situ synchrotron X-ray micro-diffraction experiments using a Laue cross-correlation approach},
author = {Zhang, Chenglu and Zhang, Yubin and Wu, Guilin and Liu, Wenjun and Xu, Ruqing and Juul Jensen, Dorte and Godfrey, Andrew},
abstractNote = {Laue micro-diffraction has proven to be able to reveal material properties at the sub-grain scale for many polycrystalline materials and is now routinely available at several synchrotron facilities, providing an approach for nondestructive three-dimensional probing of the microstructures and mechanical states of materials. However, for in situ experiments, maintaining the positioning of the sample throughout the experiment, to achieve a good alignment of the characterized volumes, is a challenging issue. The aim of the present work is to address this problem by developing an approach based on digital image correlation of focused-beam Laue diffraction patterns. The method uses small changes in the diffraction signal as a focused X-ray beam is scanned over a surface region to allow corrections to be made for both sample lateral movement and rotation. The method is demonstrated using a tensile deformation experiment on an Al sample with 2.5 µm average grain size. The results demonstrate an accuracy of 0.5 µm for sample position registration and a precision in sample rotation of ~0.01°. Finally, the proposed method is fast to implement and does not require the use of additional surface markers.},
doi = {10.1107/S1600576719010562},
journal = {Journal of Applied Crystallography (Online)},
number = 5,
volume = 52,
place = {United States},
year = {2019},
month = {9}
}

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