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Title: Crystal Structure and Orientation of Organic Semiconductor Thin Films by Microcrystal Electron Diffraction and Grazing-Incidence Wide-angle X-ray Scattering

Abstract

The complementary methods of MicroED and GIWAXS provide insight into crystal structure arrangement in organic semiconductor thin films.

Authors:
; ORCiD logo
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1607705
Alternate Identifier(s):
OSTI ID: 1604485
Report Number(s):
BNL-213761-2020-JAAM
Journal ID: ISSN 1359--7345
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Chemical Communications
Additional Journal Information:
Journal Name: Chemical Communications; Journal ID: ISSN 1359--7345
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Levine, Andrew M., and Tsai, Esther H. Crystal Structure and Orientation of Organic Semiconductor Thin Films by Microcrystal Electron Diffraction and Grazing-Incidence Wide-angle X-ray Scattering. United States: N. p., 2020. Web. doi:10.1039/D0CC00119H.
Levine, Andrew M., & Tsai, Esther H. Crystal Structure and Orientation of Organic Semiconductor Thin Films by Microcrystal Electron Diffraction and Grazing-Incidence Wide-angle X-ray Scattering. United States. doi:10.1039/D0CC00119H.
Levine, Andrew M., and Tsai, Esther H. Sat . "Crystal Structure and Orientation of Organic Semiconductor Thin Films by Microcrystal Electron Diffraction and Grazing-Incidence Wide-angle X-ray Scattering". United States. doi:10.1039/D0CC00119H.
@article{osti_1607705,
title = {Crystal Structure and Orientation of Organic Semiconductor Thin Films by Microcrystal Electron Diffraction and Grazing-Incidence Wide-angle X-ray Scattering},
author = {Levine, Andrew M. and Tsai, Esther H.},
abstractNote = {The complementary methods of MicroED and GIWAXS provide insight into crystal structure arrangement in organic semiconductor thin films.},
doi = {10.1039/D0CC00119H},
journal = {Chemical Communications},
number = ,
volume = ,
place = {United States},
year = {2020},
month = {3}
}

Journal Article:
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This content will become publicly available on March 7, 2021
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