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Title: Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering

Abstract

Here, we use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.

Authors:
ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [1]; ORCiD logo [3]; ORCiD logo [1]; ORCiD logo [2]
+ Show Author Affiliations
  1. City Univ. of New York (CUNY), NY (United States); Hunter College, New York, NY (United States)
  2. Arizona State Univ., Tempe, AZ (United States). Biodesign Inst.
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
OSTI Identifier:
1607705
Alternate Identifier(s):
OSTI ID: 1604485
Report Number(s):
BNL-213761-2020-JAAM
Journal ID: ISSN 1359-7345; CHCOFS
Grant/Contract Number:  
SC0012704; 1531991; HRD1547830; CHE-1610755
Resource Type:
Accepted Manuscript
Journal Name:
ChemComm
Additional Journal Information:
Journal Volume: 56; Journal Issue: 30; Journal ID: ISSN 1359-7345
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Levine, Andrew M., Bu, Guanhong, Biswas, Sankarsan, Tsai, Esther H. R., Braunschweig, Adam B., and Nannenga, Brent L. Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering. United States: N. p., 2020. Web. doi:10.1039/D0CC00119H.
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Levine, Andrew M., Bu, Guanhong, Biswas, Sankarsan, Tsai, Esther H. R., Braunschweig, Adam B., & Nannenga, Brent L. Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering. United States. https://doi.org/10.1039/D0CC00119H
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Levine, Andrew M., Bu, Guanhong, Biswas, Sankarsan, Tsai, Esther H. R., Braunschweig, Adam B., and Nannenga, Brent L. Sat . "Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering". United States. https://doi.org/10.1039/D0CC00119H. https://www.osti.gov/servlets/purl/1607705.
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@article{osti_1607705,
title = {Crystal structure and orientation of organic semiconductor thin films by microcrystal electron diffraction and grazing-incidence wide-angle X-ray scattering},
author = {Levine, Andrew M. and Bu, Guanhong and Biswas, Sankarsan and Tsai, Esther H. R. and Braunschweig, Adam B. and Nannenga, Brent L.},
abstractNote = {Here, we use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.},
doi = {10.1039/D0CC00119H},
journal = {ChemComm},
number = 30,
volume = 56,
place = {United States},
year = {Sat Mar 07 00:00:00 EST 2020},
month = {Sat Mar 07 00:00:00 EST 2020}
}
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Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1039/D0CC00119H
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