Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns

Lenthe, William; Singh, Saransh; De Graef, Marc

doi:10.1107/S1600576719011233

Title: Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns

Abstract

A new methodology to predict potential pseudo-symmetric or systematically mis-indexed orientations for an arbitrary crystal structure is presented. The method leverages the recently proposed spherical indexing algorithm to index electron backscatter diffraction patterns. Potential pseudo-symmetric orientations are interpreted as secondary peaks in the autocorrelation of the Kikuchi sphere. The generality of the method is illustrated using a number of crystal systems, ranging from nickel, where no significant pseudo-symmetric issues are expected, to SrTiO₃, with mild occurrence of such issues, to the olivine series, γ-TiAl and U-6%Nb systems, where the traditional Hough method systematically mis-indexes the pseudo-symmetric variants. Here, the method predicts the severity of potential pseudo-symmetric matches and ranks all variants using a normalized autocorrelation coefficient.

Authors:

Lenthe, William ^[1]; Singh, Saransh ^[2]; De Graef, Marc ^[1]

Carnegie Mellon Univ., Pittsburgh, PA (United States). Dept. of Materials Science and Engineering
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Publication Date:: Mon Sep 23 00:00:00 EDT 2019

Research Org.:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1575873

Report Number(s):: LLNL-JRNL-787810
Journal ID: ISSN 1600-5767; JACGAR; 983893

Grant/Contract Number:: AC52-07NA27344

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Applied Crystallography (Online)

Additional Journal Information:: Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 52; Journal Issue: 5; Journal ID: ISSN 1600-5767

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; electron backscatter diffraction; EBSD; pseudo-symmetry; autocorrelation; spherical harmonic transform

Citation Formats


                    Lenthe, William, Singh, Saransh, and De Graef, Marc. Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns.  United States: N. p., 2019. 
Web.  doi:10.1107/S1600576719011233.

Copy to clipboard


                    Lenthe, William, Singh, Saransh, & De Graef, Marc. Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns.  United States.  https://doi.org/10.1107/S1600576719011233

Copy to clipboard


                    Lenthe, William, Singh, Saransh, and De Graef, Marc. Mon .  
"Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns".  United States.  https://doi.org/10.1107/S1600576719011233.  https://www.osti.gov/servlets/purl/1575873.

Copy to clipboard


                    
@article{osti_1575873,

  title        = {Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns},

  author       = {Lenthe, William and Singh, Saransh and De Graef, Marc},

  abstractNote = {A new methodology to predict potential pseudo-symmetric or systematically mis-indexed orientations for an arbitrary crystal structure is presented. The method leverages the recently proposed spherical indexing algorithm to index electron backscatter diffraction patterns. Potential pseudo-symmetric orientations are interpreted as secondary peaks in the autocorrelation of the Kikuchi sphere. The generality of the method is illustrated using a number of crystal systems, ranging from nickel, where no significant pseudo-symmetric issues are expected, to SrTiO3, with mild occurrence of such issues, to the olivine series, γ-TiAl and U-6%Nb systems, where the traditional Hough method systematically mis-indexes the pseudo-symmetric variants. Here, the method predicts the severity of potential pseudo-symmetric matches and ranks all variants using a normalized autocorrelation coefficient.},

  doi          = {10.1107/S1600576719011233},

  journal      = {Journal of Applied Crystallography (Online)},

  number       = 5,

  volume       = 52,

  place        = {United States},

  year         = {Mon Sep 23 00:00:00 EDT 2019},

  month        = {Mon Sep 23 00:00:00 EDT 2019}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (DOE)

Publisher's Version of Record

https://doi.org/10.1107/S1600576719011233

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 6 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Works referenced in this record:

Orientation imaging: The emergence of a new microscopy
journal, April 1993

Adams, Brent L.; Wright, Stuart I.; Kunze, Karsten
Metallurgical Transactions A, Vol. 24, Issue 4
DOI: 10.1007/BF02656503

Risks of “Cleaning” Electron Backscatter Diffraction Data
journal, March 2010

Brewer, L. N.; Michael, J. R.
Microscopy Today, Vol. 18, Issue 2
DOI: 10.1017/S1551929510000040

Three-dimensional texture visualization approaches: applications to nickel and titanium alloys
journal, August 2017

Callahan, Patrick G.; Echlin, McLean P.; Stinville, Jean Charles
Journal of Applied Crystallography, Vol. 50, Issue 5
DOI: 10.1107/S1600576717010470

A Dictionary Approach to Electron Backscatter Diffraction Indexing
journal, June 2015

Chen, Yu H.; Park, Se Un; Wei, Dennis
Microscopy and Microanalysis, Vol. 21, Issue 3
DOI: 10.1017/S1431927615000756

Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations
journal, January 2018

Friedrich, T.; Bochmann, A.; Dinger, J.
Ultramicroscopy, Vol. 184
DOI: 10.1016/j.ultramic.2017.10.006

Evaluation of misindexing of EBSD patterns in a ferritic steel: EVALUATION OF MISINDEXING OF EBSD PATTERNS
journal, November 2012

Karthikeyan, T.; Dash, M. K.; Saroja, S.
Journal of Microscopy, Vol. 249, Issue 1
DOI: 10.1111/j.1365-2818.2012.03676.x

A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns
journal, December 2019

Lenthe, W. C.; Singh, S.; Graef, M. De
Ultramicroscopy, Vol. 207
DOI: 10.1016/j.ultramic.2019.112841

Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials
journal, September 2017

Marquardt, Katharina; De Graef, Marc; Singh, Saransh
American Mineralogist, Vol. 102, Issue 9
DOI: 10.2138/am-2017-6062

Electron backscatter diffraction beyond the mainstream: Electron backscatter diffraction beyond the mainstream
journal, October 2016

Nolze, Gert; Hielscher, Ralf; Winkelmann, Aimo
Crystal Research and Technology, Vol. 52, Issue 1
DOI: 10.1002/crat.201600252

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction
journal, January 2016

Nolze, Gert; Winkelmann, Aimo; Boyle, Alan P.
Ultramicroscopy, Vol. 160
DOI: 10.1016/j.ultramic.2015.10.010

Orientation effects on indexing of electron backscatter diffraction patterns
journal, April 2005

Nowell, Matthew M.; Wright, Stuart I.
Ultramicroscopy, Vol. 103, Issue 1
DOI: 10.1016/j.ultramic.2004.11.012

Large Strain Deformation in Uranium 6 Wt Pct Niobium
journal, November 2011

Tupper, Catherine N.; Brown, Don W.; Field, Robert D.
Metallurgical and Materials Transactions A, Vol. 43, Issue 2
DOI: 10.1007/s11661-011-0931-5

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
journal, March 2019

Wright, Stuart I.; Singh, Saransh; De Graef, Marc
Microscopy and Microanalysis, Vol. 25, Issue 3
DOI: 10.1017/S1431927619000333

Similar Records in DOE PAGES and OSTI.GOV collections:

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns

Journal Article Wright, Stuart I. ; Singh, Saransh ; De Graef, Marc - Microscopy and Microanalysis

Abstract We propose a new methodology for ranking the reflectors used in traditional Hough-based indexing of electron backscatter diffraction (EBSD) patterns. Instead of kinematic X-ray or electron structure factors (F_hkl) currently utilized, we propose the integrated Kikuchi band intensity parameter (β_hkl) based on integrated dynamical electron backscatter intensities. The proposed parameter is compared with the traditional kinematical intensity,more »« less
Cited by 3
https://doi.org/10.1017/S1431927619000333

Full Text Available
Resolving pseudosymmetry in γ-TiAl using cross-correlation electron backscatter diffraction with dynamically simulated reference patterns

Journal Article Jackson, Brian ; Fullwood, David ; Christensen, Jordan ; ... - Journal of Applied Crystallography (Online)

Pseudosymmetry is a phenomenon that occurs when grains with different lattice parameters produce nearly identical diffraction patterns such that conventional electron backscatter diffraction (EBSD) techniques are unable to unambiguously differentiate the lattice orientations. This commonly occurs in materials with near-unity tetragonality, such as γ-TiAl. The current study uses cross-correlation EBSD to resolve pseudosymmetry in γ-TiAl. Three dynamically simulated reference patterns are generated for each point in the scan, one for each of the three potential pseudosymmetric orientations, which are subsequently correlated with the original pattern using six different methods in order to identify the correct orientation. The methods are firstmore »« less
Cited by 8
https://doi.org/10.1107/s1600576718003849

Full Text Available
Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction

Journal Article Fancher, Chris M. ; Burch, Matthew J. ; Patala, Srikanth ; ... - Journal of Microscopy

The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample-to-detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally,more »« less
https://doi.org/10.1111/jmi.13077

Full Text Available
Electron channeling pattern of ceramic platelets

Journal Article Pezzotti, G ; Sakai, Mototsugu ; Aoyagi, Eiji ; ... - Journal of the American Ceramic Society; (United States)

Electron channeling patterns (ECPs), also known as pseudo-Kikuchi patterns, have been imaged in the scanning electron microscope (SEM) according to a contrast mechanism related to the variation in the signal which results from changes in the angle between the incident beam and the crystal lattice of the specimen. It has been shown that this effect makes it possible to determine systematically the crystalline orientation and symmetry of the sample, and that features of the lattice such as tilt, grain boundaries, and, in some cases, individual defects can be imaged and analyzed. Here, ECPs have been generated in the scanning electronmore »« less
https://doi.org/10.1111/j.1151-2916.1994.tb04624.x
Multivariate statistical approaches for electron backscattered diffraction.

Conference Michael, Joseph Richard ; Brewer, Luke N ; Kotula, Paul Gabriel

Electron backscattered diffraction (EBSD) is a widely used technique for both identifying the crystallographic phase and for mapping the orientation of crystalline materials on the micron length scale. Often the operating conditions necessary for phase identification are not suitable for orientation mapping and vice versa. In an effort to optimize the speed involved in the mapping technique, pattern quality is sacrificed and the wealth of information present in an EBSD pattern is compressed to basically 4 values: a matched phase and three Euler angles. However, ab initio identification of phases from EBSD patterns requires high quality patterns and fairly intensemore »« less

Similar Records

Title: Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns

Abstract

Citation Formats

Orientation imaging: The emergence of a new microscopy journal, April 1993

Risks of “Cleaning” Electron Backscatter Diffraction Data journal, March 2010

Three-dimensional texture visualization approaches: applications to nickel and titanium alloys journal, August 2017

A Dictionary Approach to Electron Backscatter Diffraction Indexing journal, June 2015

Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations journal, January 2018

Evaluation of misindexing of EBSD patterns in a ferritic steel: EVALUATION OF MISINDEXING OF EBSD PATTERNS journal, November 2012

A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns journal, December 2019

Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials journal, September 2017

Electron backscatter diffraction beyond the mainstream: Electron backscatter diffraction beyond the mainstream journal, October 2016

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction journal, January 2016

Orientation effects on indexing of electron backscatter diffraction patterns journal, April 2005

Large Strain Deformation in Uranium 6 Wt Pct Niobium journal, November 2011

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns journal, March 2019

Orientation imaging: The emergence of a new microscopy
journal, April 1993

Risks of “Cleaning” Electron Backscatter Diffraction Data
journal, March 2010

Three-dimensional texture visualization approaches: applications to nickel and titanium alloys
journal, August 2017

A Dictionary Approach to Electron Backscatter Diffraction Indexing
journal, June 2015

Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations
journal, January 2018

Evaluation of misindexing of EBSD patterns in a ferritic steel: EVALUATION OF MISINDEXING OF EBSD PATTERNS
journal, November 2012

A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns
journal, December 2019

Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials
journal, September 2017

Electron backscatter diffraction beyond the mainstream: Electron backscatter diffraction beyond the mainstream
journal, October 2016

Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction
journal, January 2016

Orientation effects on indexing of electron backscatter diffraction patterns
journal, April 2005

Large Strain Deformation in Uranium 6 Wt Pct Niobium
journal, November 2011

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
journal, March 2019