Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns
Abstract
Abstract We propose a new methodology for ranking the reflectors used in traditional Hough-based indexing of electron backscatter diffraction (EBSD) patterns. Instead of kinematic X-ray or electron structure factors (Fhkl) currently utilized, we propose the integrated Kikuchi band intensity parameter (βhkl) based on integrated dynamical electron backscatter intensities. The proposed parameter is compared with the traditional kinematical intensity, $$I_{hkl}^{{\rm kin}} $$, as well as the average Hough transform peak intensity, $$I_{hkl}^{{\rm HSP}} $$ and used to index EBSD patterns for a number of different material systems of varying unit cell complexities including nickel, silicon, rutile, and forsterite. For elemental structures, βhkl closely follows the kinematical ranking. However, significant ranking differences arise for more complex unit cells, with the βhkl parameter showing a better correlation with the integrated Hough intensities. Lastly, Hough-based indexing of a simulated forsterite data set showed an appreciable improvement in the median confidence index (0.15 to 0.35) whenβhklis used instead of $$I_{hkl}^{{\rm kin}} $$ for ranking the reflectors.
- Authors:
-
[3]
- EDAX, Draper, UT (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Carnegie Mellon Univ., Pittsburgh, PA (United States)
- Carnegie Mellon Univ., Pittsburgh, PA (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1575868
- Report Number(s):
- LLNL-JRNL-762497
Journal ID: ISSN 1431-9276; 951235
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Microscopy and Microanalysis
- Additional Journal Information:
- Journal Volume: 25; Journal Issue: 3; Journal ID: ISSN 1431-9276
- Publisher:
- Microscopy Society of America (MSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; EBSD; Electron Backscatter Diffraction; Dynamical Simulations; Indexing
Citation Formats
Wright, Stuart I., Singh, Saransh, and De Graef, Marc. Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. United States: N. p., 2019.
Web. doi:10.1017/S1431927619000333.
Wright, Stuart I., Singh, Saransh, & De Graef, Marc. Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns. United States. https://doi.org/10.1017/S1431927619000333
Wright, Stuart I., Singh, Saransh, and De Graef, Marc. Wed .
"Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns". United States. https://doi.org/10.1017/S1431927619000333. https://www.osti.gov/servlets/purl/1575868.
@article{osti_1575868,
title = {Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns},
author = {Wright, Stuart I. and Singh, Saransh and De Graef, Marc},
abstractNote = {Abstract We propose a new methodology for ranking the reflectors used in traditional Hough-based indexing of electron backscatter diffraction (EBSD) patterns. Instead of kinematic X-ray or electron structure factors (Fhkl) currently utilized, we propose the integrated Kikuchi band intensity parameter (βhkl) based on integrated dynamical electron backscatter intensities. The proposed parameter is compared with the traditional kinematical intensity, $I_{hkl}^{{\rm kin}} $, as well as the average Hough transform peak intensity, $I_{hkl}^{{\rm HSP}} $ and used to index EBSD patterns for a number of different material systems of varying unit cell complexities including nickel, silicon, rutile, and forsterite. For elemental structures, βhkl closely follows the kinematical ranking. However, significant ranking differences arise for more complex unit cells, with the βhkl parameter showing a better correlation with the integrated Hough intensities. Lastly, Hough-based indexing of a simulated forsterite data set showed an appreciable improvement in the median confidence index (0.15 to 0.35) whenβhklis used instead of $I_{hkl}^{{\rm kin}} $ for ranking the reflectors.},
doi = {10.1017/S1431927619000333},
journal = {Microscopy and Microanalysis},
number = 3,
volume = 25,
place = {United States},
year = {Wed Mar 27 00:00:00 EDT 2019},
month = {Wed Mar 27 00:00:00 EDT 2019}
}
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Works referenced in this record:
Computation of absorptive form factors for high-energy electron diffraction
journal, September 1991
- Weickenmeier, A.; Kohl, H.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 47, Issue 5
Relativistic Hartree–Fock X-ray and electron scattering factors
journal, May 1968
- Doyle, P. A.; Turner, P. S.
- Acta Crystallographica Section A, Vol. 24, Issue 3
New uniform grids on the sphere
journal, September 2010
- Roşca, D.
- Astronomy and Astrophysics, Vol. 520
Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction
journal, November 2008
- Winkelmann, Aimo
- Ultramicroscopy, Vol. 108, Issue 12
Dirac–Fock calculations of X-ray scattering factors and contributions to the mean inner potential for electron scattering
journal, July 1994
- Rez, D.; Rez, P.; Grant, I.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 50, Issue 4
An accurate parameterization for scattering factors, electron densities and electrostatic potentials for neutral atoms that obey all physical constraints
journal, October 2014
- Lobato, I.; Van Dyck, D.
- Acta Crystallographica Section A Foundations and Advances, Vol. 70, Issue 6
A method for accurate localisation of EBSD pattern centres
journal, January 2011
- Maurice, Claire; Dzieciol, Krzysztof; Fortunier, Roland
- Ultramicroscopy, Vol. 111, Issue 2
Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction: KIKUCHI PATTERN SIMULATION FOR EBSD
journal, December 2009
- Winkelmann, A.
- Journal of Microscopy, Vol. 239, Issue 1
Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations
journal, June 2013
- Callahan, Patrick G.; De Graef, Marc
- Microscopy and Microanalysis, Vol. 19, Issue 5
Relativistic Hartree–Fock X-ray and electron atomic scattering factors at high angles
journal, November 1989
- Fox, A. G.; O'Keefe, M. A.; Tabbernor, M. A.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 45, Issue 11
Orientation sampling for dictionary-based diffraction pattern indexing methods
journal, November 2016
- Singh, S.; De Graef, M.
- Modelling and Simulation in Materials Science and Engineering, Vol. 24, Issue 8
The analytical representation of atomic scattering amplitudes for electrons
journal, March 1962
- Smith, G. H.; Burge, R. E.
- Acta Crystallographica, Vol. 15, Issue 3
Introduction to Conventional Transmission Electron Microscopy
journal, October 2003
- Murr, L. E.
- Materials Characterization, Vol. 51, Issue 2-3
Introduction to Conventional Transmission Electron Microscopy
journal, October 2003
- Wang, Z. L.
- Materials Research Bulletin, Vol. 38, Issue 13