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Title: Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale

Abstract

Two-dimensional materials, including graphene, transition metal dichalcogenides and their heterostructures, exhibit great potential for a variety of applications, such as transistors, spintronics, and photovoltaics. While the miniaturization offers remarkable improvements in electrical performance, heat dissipation and thermal mismatch can be a problem in designing electronic devices based on two-dimensional materials. Quantifying the thermal expansion coefficient of 2D materials requires temperature measurements at nanometer scale. Here, we introduce a novel nanometer-scale thermometry approach to measure temperature and quantify the thermal expansion coefficients in 2D materials based on scanning transmission electron microscopy combined with electron energy-loss spectroscopy to determine the energy shift of the plasmon resonance peak of 2D materials as a function of sample temperature. Iin this work, by combining these measurements with first-principles modeling, the thermal expansion coefficients (TECs) of single-layer and freestanding graphene and bulk, as well as monolayer MoS2, MoSe2, WS2, orWSe2, are directly determined and mapped.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1]
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  1. Univ. of Illinois, Chicago, IL (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC)
Sponsoring Org.:
USDOE; National Science Foundation (NSF)
OSTI Identifier:
1544329
Alternate Identifier(s):
OSTI ID: 1419365
Grant/Contract Number:  
EFMA-1542864; DMR-0959470; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 120; Journal Issue: 5; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Hu, Xuan, Yasaei, Poya, Jokisaari, Jacob, Öğüt, Serdar, Salehi-Khojin, Amin, and Klie, Robert F. Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale. United States: N. p., 2018. Web. doi:10.1103/physrevlett.120.055902.
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Hu, Xuan, Yasaei, Poya, Jokisaari, Jacob, Öğüt, Serdar, Salehi-Khojin, Amin, & Klie, Robert F. Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale. United States. https://doi.org/10.1103/physrevlett.120.055902
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Hu, Xuan, Yasaei, Poya, Jokisaari, Jacob, Öğüt, Serdar, Salehi-Khojin, Amin, and Klie, Robert F. Fri . "Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale". United States. https://doi.org/10.1103/physrevlett.120.055902. https://www.osti.gov/servlets/purl/1544329.
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@article{osti_1544329,
title = {Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale},
author = {Hu, Xuan and Yasaei, Poya and Jokisaari, Jacob and Öğüt, Serdar and Salehi-Khojin, Amin and Klie, Robert F.},
abstractNote = {Two-dimensional materials, including graphene, transition metal dichalcogenides and their heterostructures, exhibit great potential for a variety of applications, such as transistors, spintronics, and photovoltaics. While the miniaturization offers remarkable improvements in electrical performance, heat dissipation and thermal mismatch can be a problem in designing electronic devices based on two-dimensional materials. Quantifying the thermal expansion coefficient of 2D materials requires temperature measurements at nanometer scale. Here, we introduce a novel nanometer-scale thermometry approach to measure temperature and quantify the thermal expansion coefficients in 2D materials based on scanning transmission electron microscopy combined with electron energy-loss spectroscopy to determine the energy shift of the plasmon resonance peak of 2D materials as a function of sample temperature. Iin this work, by combining these measurements with first-principles modeling, the thermal expansion coefficients (TECs) of single-layer and freestanding graphene and bulk, as well as monolayer MoS2, MoSe2, WS2, orWSe2, are directly determined and mapped.},
doi = {10.1103/physrevlett.120.055902},
journal = {Physical Review Letters},
number = 5,
volume = 120,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2018},
month = {Fri Feb 02 00:00:00 EST 2018}
}
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https://doi.org/10.1103/physrevlett.120.055902
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