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Title: Ultrafast shock compression of PDMS-based polymers

Abstract

ABSTRACT The shock response of polymers is important for a number of commercial and defense‐related applications, but it is difficult to obtain empirical shock response data over the wide range of preparations and aging conditions typically found in such applications. Ultrafast compression is useful to characterize polymer shock response over a wide range of polymer initial conditions due to the high throughput of this method. To establish greater confidence in ultrafast compression experiments and to characterize the detailed shock response of several variations in a single base polymer, the results of sub‐nanosecond shock compression experiments in ∼5 μm thick layers of the polydimethylsiloxane (PDMS)‐based elastomeric rubbers Sylgard‐184, SE1700, and an unfilled, end‐linked model PDMS network are presented. The results of conventional ultrafast shock etalon measurements to time‐of‐flight measurements for similar thickness layers of irradiated and unirradiated SE1700 are compared. Good agreement between the shock response measured by these two ultrafast shock methods, as well as consistency between ultrafast data and long time scale gas gun data is found. From measurements across a variety of PDMS formulations, a statistically significant variation in the shock response with the quasistatic elastic modulus is presented. Published 2018. J. Polym. Sci., Part B: Polym.more » Phys. 2018 , 56 , 827–832« less

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1458706
Alternate Identifier(s):
OSTI ID: 1421566
Report Number(s):
LLNL-JRNL-741919
Journal ID: ISSN 0887-6266; 895994
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Polymer Science. Part B, Polymer Physics
Additional Journal Information:
Journal Volume: 56; Journal Issue: 11; Journal ID: ISSN 0887-6266
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; compression; dynamic mechanical properties; elastomers; irradiation; polydimethylsiloxane; response; shock; strain; strength; ultrafast

Citation Formats

Armstrong, Michael R., Grivickas, Paulius V., Sawvel, April M., Lewicki, James P., Crowhurst, Jonathan C., Zaug, Joseph M., Radousky, Harry B., Stavrou, Elissaios, Alviso, Cynthia T., Hamilton, Julie, and Maxwell, Robert S. Ultrafast shock compression of PDMS-based polymers. United States: N. p., 2018. Web. doi:10.1002/polb.24589.
Armstrong, Michael R., Grivickas, Paulius V., Sawvel, April M., Lewicki, James P., Crowhurst, Jonathan C., Zaug, Joseph M., Radousky, Harry B., Stavrou, Elissaios, Alviso, Cynthia T., Hamilton, Julie, & Maxwell, Robert S. Ultrafast shock compression of PDMS-based polymers. United States. https://doi.org/10.1002/polb.24589
Armstrong, Michael R., Grivickas, Paulius V., Sawvel, April M., Lewicki, James P., Crowhurst, Jonathan C., Zaug, Joseph M., Radousky, Harry B., Stavrou, Elissaios, Alviso, Cynthia T., Hamilton, Julie, and Maxwell, Robert S. Fri . "Ultrafast shock compression of PDMS-based polymers". United States. https://doi.org/10.1002/polb.24589. https://www.osti.gov/servlets/purl/1458706.
@article{osti_1458706,
title = {Ultrafast shock compression of PDMS-based polymers},
author = {Armstrong, Michael R. and Grivickas, Paulius V. and Sawvel, April M. and Lewicki, James P. and Crowhurst, Jonathan C. and Zaug, Joseph M. and Radousky, Harry B. and Stavrou, Elissaios and Alviso, Cynthia T. and Hamilton, Julie and Maxwell, Robert S.},
abstractNote = {ABSTRACT The shock response of polymers is important for a number of commercial and defense‐related applications, but it is difficult to obtain empirical shock response data over the wide range of preparations and aging conditions typically found in such applications. Ultrafast compression is useful to characterize polymer shock response over a wide range of polymer initial conditions due to the high throughput of this method. To establish greater confidence in ultrafast compression experiments and to characterize the detailed shock response of several variations in a single base polymer, the results of sub‐nanosecond shock compression experiments in ∼5 μm thick layers of the polydimethylsiloxane (PDMS)‐based elastomeric rubbers Sylgard‐184, SE1700, and an unfilled, end‐linked model PDMS network are presented. The results of conventional ultrafast shock etalon measurements to time‐of‐flight measurements for similar thickness layers of irradiated and unirradiated SE1700 are compared. Good agreement between the shock response measured by these two ultrafast shock methods, as well as consistency between ultrafast data and long time scale gas gun data is found. From measurements across a variety of PDMS formulations, a statistically significant variation in the shock response with the quasistatic elastic modulus is presented. Published 2018. † J. Polym. Sci., Part B: Polym. Phys. 2018 , 56 , 827–832},
doi = {10.1002/polb.24589},
journal = {Journal of Polymer Science. Part B, Polymer Physics},
number = 11,
volume = 56,
place = {United States},
year = {Fri Feb 16 00:00:00 EST 2018},
month = {Fri Feb 16 00:00:00 EST 2018}
}

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Free Publicly Available Full Text
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Cited by: 12 works
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Figures / Tables:

Figure 1 Figure 1: The experimental scheme. a) A wide-view schematic of the experiment; b) A close-up of the sample geometry; c) A picture of the sample from the receiver side. The squares are aluminum receivers. Shots on (for ToF arrival) and off (for shock etalon/piston arrival) the receivers are shown; d)more » a surface profile of the sample showing the Al/Ti ablation surface in blue and the receiver surfaces in red. The scale bar gives optical thickness, where the actual thickness is the optical thickness divided by the index of refraction.« less

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