Review of phase measuring deflectometry

Huang, Lei; Idir, Mourad; Zuo, Chao; Asundi, Anand

doi:10.1016/j.optlaseng.2018.03.026

Title: Review of phase measuring deflectometry

Journal Article · 06 April 2018 · Optics and Lasers in Engineering

DOI: https://doi.org/10.1016/j.optlaseng.2018.03.026 · OSTI ID:1438323

Huang, Lei ^[1]; Idir, Mourad ^[1]; Zuo, Chao ^[2]; Asundi, Anand ^[3]

Brookhaven National Lab. (BNL), Upton, NY (United States)
Nanjing Univ. of Science and Technology, Nanjing (China)
Nanyang Technological Univ. (Singapore)

As a low cost, full-field three-dimensional shape measurement technique with high dynamic range, Phase Measuring Deflectometry (PMD) has been studied and improved to be a simple and effective manner to inspect specular reflecting surfaces. In this review, the fundamental principle and the basic concepts of PMD technique are introduced and followed by a brief overview of its key developments since it was first proposed. In addition, the similarities and differences compared with other related techniques are discussed to highlight the distinguishing features of the PMD technique. In conclusion, we will address the major challenges, the existing solutions and the remaining limitations in this technique to provide some suggestions for potential future investigations.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0012704

OSTI ID:: 1438323

Alternate ID(s):: OSTI ID: 1630197

Report Number(s):: BNL--205684-2018-JAAM

Journal Information:: Optics and Lasers in Engineering, Journal Name: Optics and Lasers in Engineering Journal Issue: C Vol. 107; ISSN 0143-8166

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Improving the calibration of phase measuring deflectometry by a polynomial representation of the display shape Bartsch, Jonas; Kalms, Michael; Bergmann, Ralf B. Journal of the European Optical Society-Rapid Publications, Vol. 15, Issue 1 https://doi.org/10.1186/s41476-019-0116-1	journal	September 2019
Deflectometry in cylindrical coordinates using a conical mirror: principles and proof of concept Carvalho, Marcos José Ferreira; Veiga, Celso Luiz Nickel; Albertazzi, Armando Journal of the Brazilian Society of Mechanical Sciences and Engineering, Vol. 41, Issue 9 https://doi.org/10.1007/s40430-019-1885-6	journal	August 2019
Structured Light Profilometry on m-PTC Marotta, Gianluca; Sansoni, Paola; Francini, Franco Energies, Vol. 13, Issue 21 https://doi.org/10.3390/en13215671	journal	October 2020
Dual-projector structured light 3D shape measurement Yu, Ying; Lau, Daniel L.; Ruffner, Matthew P. Applied Optics, Vol. 59, Issue 4 https://doi.org/10.1364/ao.378363	journal	January 2020
Solution to the slope-height ambiguity problem in phase measuring deflectometry based on a co-axial telecentric optical path Yue, Hui-Min; Wu, Yu-Xiang; Song, Yi-Ping Measurement Science and Technology, Vol. 31, Issue 4 https://doi.org/10.1088/1361-6501/ab472f	journal	January 2020
A novel direct structured-light inspection technique for contaminant and defect detection Huang, Yiyang arXiv https://doi.org/10.48550/arxiv.2006.12186	preprint	January 2020
Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces Xu, Xueyang; Zhang, Xiangchao; Niu, Zhenqi Optics Letters, Vol. 44, Issue 17 https://doi.org/10.1364/ol.44.004271	journal	January 2019
An Accurate Calibration Means for the Phase Measuring Deflectometry System Han, Hao; Wu, Shiqian; Song, Zhan Sensors, Vol. 19, Issue 24 https://doi.org/10.3390/s19245377	journal	December 2019
Measurement of the Three-Dimensional Shape of Discontinuous Specular Objects Using Infrared Phase-Measuring Deflectometry Chang, Caixia; Zhang, Zonghua; Gao, Nan Sensors, Vol. 19, Issue 21 https://doi.org/10.3390/s19214621	journal	October 2019
Measurement of the Three-Dimensional Shape of Discontinuous Specular Objects Using Infrared Phase-Measuring Deflectometry Chang, Caixia; Zhang, Zonghua; Gao, Nan Sensors, Vol. 19, Issue 21 https://doi.org/10.3390/s19214621	journal	October 2019

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Phase measuring deflectometry
Structure light illumination
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Fringe analysis
Phase shift
Wavefront reconstruction

Title: Review of phase measuring deflectometry

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