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This content will become publicly available on April 7, 2019

Title: Review of phase measuring deflectometry

As a low cost, full-field three-dimensional shape measurement technique with high dynamic range, Phase Measuring Deflectometry (PMD) has been studied and improved to be a simple and effective manner to inspect specular reflecting surfaces. In this review, the fundamental principle and the basic concepts of PMD technique are introduced and followed by a brief overview of its key developments since it was first proposed. In addition, the similarities and differences compared with other related techniques are discussed to highlight the distinguishing features of the PMD technique. In conclusion, we will address the major challenges, the existing solutions and the remaining limitations in this technique to provide some suggestions for potential future investigations.
Authors:
 [1] ;  [1] ;  [2] ;  [3]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Nanjing Univ. of Science and Technology, Nanjing (China)
  3. Nanyang Technological Univ. (Singapore)
Publication Date:
Report Number(s):
BNL-205684-2018-JAAM
Journal ID: ISSN 0143-8166
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Optics and Lasers in Engineering
Additional Journal Information:
Journal Volume: 107; Journal Issue: C; Journal ID: ISSN 0143-8166
Publisher:
Elsevier
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; Phase measuring deflectometry; Structure light illumination; Phase retrieval; Fringe analysis; Phase shift; Wavefront reconstruction
OSTI Identifier:
1438323