Sputter-Deposited Oxides for Interface Passivation of CdTe Photovoltaics
Abstract
Commercial CdTe PV modules have polycrystalline thin films deposited on glass, and devices made in this format have exceeded 22% efficiency. Devices made by the authors with a magnesium zinc oxide window layer and tellurium back contact have achieved efficiency over 18%, but these cells still suffer from an open-circuit voltage far below ideal values. Oxide passivation layers made by sputter deposition have the potential to increase voltage by reducing interface recombination. CdTe devices with these passivation layers were studied with photoluminescence (PL) emission spectroscopy and time-resolved photoluminescence (TRPL) to detect an increase in minority carrier lifetime. Because these oxide materials exhibit barriers to carrier collection, micropatterning was used to expose small point contacts while still allowing interface passivation. TRPL decay lifetimes have been greatly enhanced for thin polycrystalline absorber films with interface passivation. Device performance was measured and current collection was mapped spatially by light-beam-induced current.
- Authors:
-
- Colorado State Univ., Fort Collins, CO (United States)
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Publication Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1422874
- Report Number(s):
- NREL/JA-5900-70431
Journal ID: ISSN 2156-3381
- Grant/Contract Number:
- AC36-08GO28308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- IEEE Journal of Photovoltaics
- Additional Journal Information:
- Journal Volume: 8; Journal Issue: 2; Journal ID: ISSN 2156-3381
- Publisher:
- IEEE
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; passivation; II-VI semiconductor materials; cadmium compounds; aluminum oxide; sputtering; photovoltaic systems
Citation Formats
Kephart, Jason M., Kindvall, Anna, Williams, Desiree, Kuciauskas, Darius, Dippo, Pat, Munshi, Amit, and Sampath, W. S. Sputter-Deposited Oxides for Interface Passivation of CdTe Photovoltaics. United States: N. p., 2018.
Web. doi:10.1109/JPHOTOV.2017.2787021.
Kephart, Jason M., Kindvall, Anna, Williams, Desiree, Kuciauskas, Darius, Dippo, Pat, Munshi, Amit, & Sampath, W. S. Sputter-Deposited Oxides for Interface Passivation of CdTe Photovoltaics. United States. https://doi.org/10.1109/JPHOTOV.2017.2787021
Kephart, Jason M., Kindvall, Anna, Williams, Desiree, Kuciauskas, Darius, Dippo, Pat, Munshi, Amit, and Sampath, W. S. Thu .
"Sputter-Deposited Oxides for Interface Passivation of CdTe Photovoltaics". United States. https://doi.org/10.1109/JPHOTOV.2017.2787021. https://www.osti.gov/servlets/purl/1422874.
@article{osti_1422874,
title = {Sputter-Deposited Oxides for Interface Passivation of CdTe Photovoltaics},
author = {Kephart, Jason M. and Kindvall, Anna and Williams, Desiree and Kuciauskas, Darius and Dippo, Pat and Munshi, Amit and Sampath, W. S.},
abstractNote = {Commercial CdTe PV modules have polycrystalline thin films deposited on glass, and devices made in this format have exceeded 22% efficiency. Devices made by the authors with a magnesium zinc oxide window layer and tellurium back contact have achieved efficiency over 18%, but these cells still suffer from an open-circuit voltage far below ideal values. Oxide passivation layers made by sputter deposition have the potential to increase voltage by reducing interface recombination. CdTe devices with these passivation layers were studied with photoluminescence (PL) emission spectroscopy and time-resolved photoluminescence (TRPL) to detect an increase in minority carrier lifetime. Because these oxide materials exhibit barriers to carrier collection, micropatterning was used to expose small point contacts while still allowing interface passivation. TRPL decay lifetimes have been greatly enhanced for thin polycrystalline absorber films with interface passivation. Device performance was measured and current collection was mapped spatially by light-beam-induced current.},
doi = {10.1109/JPHOTOV.2017.2787021},
journal = {IEEE Journal of Photovoltaics},
number = 2,
volume = 8,
place = {United States},
year = {Thu Jan 18 00:00:00 EST 2018},
month = {Thu Jan 18 00:00:00 EST 2018}
}
Web of Science
Figures / Tables:
Works referencing / citing this record:
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