Distinguishing bulk and surface recombination in CdTe thin films and solar cells using time-resolved terahertz and photoluminescence spectroscopies
Abstract
Understanding the nature of recombination and its dependence on defects and interfaces is essential for engineering materials and contacts for higher open circuit voltage (Voc) and power conversion efficiency in photovoltaic (PV) devices. Time-resolved photoluminescence (TRPL) has conventionally been used to evaluate recombination, but carrier redistribution often dominates the response at short times. In this work, we report on the quantification of carrier dynamics and recombination mechanisms by complementary use of both time-resolved terahertz spectroscopy (TRTS) and TRPL combined with numerical modeling of the continuity equations and Poisson’s equation. We have demonstrated this approach using CdTe thin films. A thin film stack with CdTe fabricated by vapor transport deposition and treated with CdCl2 exhibited a bulk lifetime of 1.7 ± 0.1 ns, negligible CdTe/CdS interface recombination velocity, and back surface recombination velocity of 6.3 ± 1.3 x104 cm/s. In contrast, a film stack without CdCl2 treatment had a bulk lifetime of only 68 ± 12 ps and a higher interface recombination velocity of 4 ± 2 x108 cm/s. By determining the locus and mechanisms of performance-limiting recombination, we can accelerate the development of thin-film PVs with higher Voc and efficiency. While the method has been demonstrated here using CdTe, itmore »
- Authors:
-
[1];
[1];
[2];
[3];
[3];
[1]
- Drexel Univ., Philadelphia, PA (United States)
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Univ. of Delaware, Newark, DE (United States)
- Publication Date:
- Research Org.:
- Drexel Univ., Philadelphia, PA (United States); National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1828279
- Alternate Identifier(s):
- OSTI ID: 1828070; OSTI ID: 1834559
- Report Number(s):
- NREL/JA-5900-81617
Journal ID: ISSN 0021-8979; DE-EE0008986; TRN: US2216039
- Grant/Contract Number:
- EE0008986; AC36-08GO28308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 130; Journal Issue: 16; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; photovoltaics; solar cells; CdTe; recombination; time-resolved terahertz spectroscopy; time-resolved photoluminescence; semiconductors; terahertz spectroscopy; thin film devices
Citation Formats
Taheri, Mohammad M., Truong, Triet M., Li, Siming, Shafarman, William N., McCandless, Brian E., and Baxter, Jason B. Distinguishing bulk and surface recombination in CdTe thin films and solar cells using time-resolved terahertz and photoluminescence spectroscopies. United States: N. p., 2021.
Web. doi:10.1063/5.0064730.
Taheri, Mohammad M., Truong, Triet M., Li, Siming, Shafarman, William N., McCandless, Brian E., & Baxter, Jason B. Distinguishing bulk and surface recombination in CdTe thin films and solar cells using time-resolved terahertz and photoluminescence spectroscopies. United States. https://doi.org/10.1063/5.0064730
Taheri, Mohammad M., Truong, Triet M., Li, Siming, Shafarman, William N., McCandless, Brian E., and Baxter, Jason B. Thu .
"Distinguishing bulk and surface recombination in CdTe thin films and solar cells using time-resolved terahertz and photoluminescence spectroscopies". United States. https://doi.org/10.1063/5.0064730. https://www.osti.gov/servlets/purl/1828279.
@article{osti_1828279,
title = {Distinguishing bulk and surface recombination in CdTe thin films and solar cells using time-resolved terahertz and photoluminescence spectroscopies},
author = {Taheri, Mohammad M. and Truong, Triet M. and Li, Siming and Shafarman, William N. and McCandless, Brian E. and Baxter, Jason B.},
abstractNote = {Understanding the nature of recombination and its dependence on defects and interfaces is essential for engineering materials and contacts for higher open circuit voltage (Voc) and power conversion efficiency in photovoltaic (PV) devices. Time-resolved photoluminescence (TRPL) has conventionally been used to evaluate recombination, but carrier redistribution often dominates the response at short times. In this work, we report on the quantification of carrier dynamics and recombination mechanisms by complementary use of both time-resolved terahertz spectroscopy (TRTS) and TRPL combined with numerical modeling of the continuity equations and Poisson’s equation. We have demonstrated this approach using CdTe thin films. A thin film stack with CdTe fabricated by vapor transport deposition and treated with CdCl2 exhibited a bulk lifetime of 1.7 ± 0.1 ns, negligible CdTe/CdS interface recombination velocity, and back surface recombination velocity of 6.3 ± 1.3 x104 cm/s. In contrast, a film stack without CdCl2 treatment had a bulk lifetime of only 68 ± 12 ps and a higher interface recombination velocity of 4 ± 2 x108 cm/s. By determining the locus and mechanisms of performance-limiting recombination, we can accelerate the development of thin-film PVs with higher Voc and efficiency. While the method has been demonstrated here using CdTe, it is also applicable to perovskites, Cu(InGa)Se2, Cu2ZnSn(S,Se)4, and emerging technologies.},
doi = {10.1063/5.0064730},
journal = {Journal of Applied Physics},
number = 16,
volume = 130,
place = {United States},
year = {Thu Oct 28 00:00:00 EDT 2021},
month = {Thu Oct 28 00:00:00 EDT 2021}
}
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