Bragg projection ptychography on niobium phase domain

Burdet, Nicolas; Shi, Xiaowen; Huang, Xiaojing; Clark, Jesse N.; Harder, Ross; Robinson, Ian K.

doi:10.1103/PhysRevB.96.014109

Title: Bragg projection ptychography on niobium phase domain

Abstract

Here, we demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg “dark field” imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analyzed with the help of a careful combination of implemented refinement mechanisms.

Authors:

Burdet, Nicolas ^[1]; Shi, Xiaowen ^[2]; Huang, Xiaojing ^[3]; Clark, Jesse N. ^[4]; Harder, Ross ^[5]; Robinson, Ian K. ^[6]

Univ. College London, London (United Kingdom)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Advanced Photon Source, Argonne, IL (United States)
Univ. College London, London (United Kingdom); Research Complex at Harwell, Oxford (United Kingdom)

Publication Date:: Wed Aug 10 00:00:00 EDT 2016

Research Org.:: Brookhaven National Laboratory (BNL), Upton, NY (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1340350

Alternate Identifier(s):: OSTI ID: 1371499; OSTI ID: 1374382

Report Number(s):: BNL-112069-2016-JA
Journal ID: ISSN 2469-9950

Grant/Contract Number:: SC00112704; AC02-06CH11357; FG02-11ER46831; AC02-76SF00515; FG02-11DMR-9724294; EP/G068437/1; EP/I022562/1ER46831

Resource Type:: Accepted Manuscript

Journal Name:: Physical Review B

Additional Journal Information:: Journal Volume: 96; Journal Issue: 01; Journal ID: ISSN 2469-9950

Publisher:: American Physical Society (APS)

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE

Citation Formats


                    Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, and Robinson, Ian K. Bragg projection ptychography on niobium phase domain.  United States: N. p., 2016. 
Web.  doi:10.1103/PhysRevB.96.014109.

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                    Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, & Robinson, Ian K. Bragg projection ptychography on niobium phase domain.  United States.  https://doi.org/10.1103/PhysRevB.96.014109

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                    Burdet, Nicolas, Shi, Xiaowen, Huang, Xiaojing, Clark, Jesse N., Harder, Ross, and Robinson, Ian K. Wed .  
"Bragg projection ptychography on niobium phase domain".  United States.  https://doi.org/10.1103/PhysRevB.96.014109.  https://www.osti.gov/servlets/purl/1340350.

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@article{osti_1340350,

  title        = {Bragg projection ptychography on niobium phase domain},

  author       = {Burdet, Nicolas and Shi, Xiaowen and Huang, Xiaojing and Clark, Jesse N. and Harder, Ross and Robinson, Ian K.},

  abstractNote = {Here, we demonstrate that the highly sensitive phase-contrast properties of Bragg coherent diffraction measurements combined with the translational diversity of ptychography can provide a Bragg “dark field” imaging method capable of revealing the finger print of domain structure in metallic thin films. Experimental diffraction data was taken from a epitaxially grown niobium metallic thin film on sapphire; and analyzed with the help of a careful combination of implemented refinement mechanisms.},

  doi          = {10.1103/PhysRevB.96.014109},

  journal      = {Physical Review B},

  number       = 01,

  volume       = 96,

  place        = {United States},

  year         = {Wed Aug 10 00:00:00 EDT 2016},

  month        = {Wed Aug 10 00:00:00 EDT 2016}

}

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Journal Article:

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https://doi.org/10.1103/PhysRevB.96.014109

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Cited by: 4 works

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Figure 1: Schematic of Bragg projection on a idealised niobium thin film presenting only one layer of structural domain. By performing laboratory scans, the projected overlap after the beam displacement is symmetric and of equal magnitudes within the detector plane (a’b’ = a”b”) for the specular case, as in [13].

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Works referencing / citing this record:

X-ray ptychography on low-dimensional hard-condensed matter materials
journal, March 2019

Shi, Xiaowen; Burdet, Nicolas; Chen, Bo
Applied Physics Reviews, Vol. 6, Issue 1
DOI: 10.1063/1.5045131

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Title: Bragg projection ptychography on niobium phase domain

Abstract

Citation Formats

Figures / Tables:

Phase retrieval with transverse translation diversity: a nonlinear optimization approach journal, January 2008

Radiation-induced bending of silicon-on-insulator nanowires probed by coherent x-ray diffractive imaging journal, June 2012

Parallel ptychographic reconstruction journal, January 2014

Biological imaging by soft x-ray diffraction microscopy journal, October 2005

The growth and structure of epitaxial niobium on sapphire journal, December 2001

A phase retrieval algorithm for shifting illumination journal, November 2004

Reconstructing state mixtures from diffraction measurements journal, February 2013

X-ray scattering from misfit dislocations in heteroepitaxial films: The case of Nb(110) on Al2O3 journal, January 2001

An improved ptychographical phase retrieval algorithm for diffractive imaging journal, September 2009

Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens journal, October 2016

Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens journal, July 1999

Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography journal, April 2013

Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography journal, May 2015

Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography journal, April 2014

Efficient subpixel image registration algorithms journal, January 2008

High-throughput ptychography using Eiger-scanning X-ray nano-imaging of extended regions journal, January 2014

Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography journal, September 2012

Strain Effects on the Crystal Growth and Superconducting Properties of Epitaxial Niobium Ultrathin Films journal, March 2012

High-resolution ab initio three-dimensional x-ray diffraction microscopy journal, January 2006

Ptychographic coherent diffractive imaging with orthogonal probe relaxation journal, January 2016

Evolutionary determination of experimental parameters for ptychographical imaging journal, June 2011

X-ray phase nanotomography through ptychographic coherent lensless imaging conference, October 2011

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography journal, November 2016

Chemical composition mapping with nanometre resolution by soft X-ray microscopy journal, September 2014

An annealing algorithm to correct positioning errors in ptychography journal, September 2012

High-resolution projection image reconstruction of thick objects by hard x-ray diffraction microscopy journal, December 2010

Translation position determination in ptychographic coherent diffraction imaging journal, January 2013

Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction journal, October 2001

Commensurate and incommensurate structures in molecular beam epitaxially grown Ge x Si 1 − x films on Si(100) journal, August 1984

Three-dimensional high-resolution quantitative microscopy of extended crystals journal, September 2011

Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure journal, November 2015

Constraints on the growth of metallic superlattices journal, September 1988

Probe retrieval in ptychographic coherent diffractive imaging journal, March 2009

Coherent x-ray diffraction imaging of grown-in antiphase boundaries in Fe 65 Al 35 journal, July 2007

Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films journal, October 2016

Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction text, January 2001

X-ray ptychography on low-dimensional hard-condensed matter materials journal, March 2019

Phase retrieval with transverse translation diversity: a nonlinear optimization approach
journal, January 2008

Radiation-induced bending of silicon-on-insulator nanowires probed by coherent x-ray diffractive imaging
journal, June 2012

Parallel ptychographic reconstruction
journal, January 2014

Biological imaging by soft x-ray diffraction microscopy
journal, October 2005

The growth and structure of epitaxial niobium on sapphire
journal, December 2001

A phase retrieval algorithm for shifting illumination
journal, November 2004

Reconstructing state mixtures from diffraction measurements
journal, February 2013

X-ray scattering from misfit dislocations in heteroepitaxial films: The case of Nb(110) on Al2O3
journal, January 2001

An improved ptychographical phase retrieval algorithm for diffractive imaging
journal, September 2009

Dark-field X-ray ptychography: Towards high-resolution imaging of thick and unstained biological specimens
journal, October 2016

Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens
journal, July 1999

Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography
journal, April 2013

Strain in a silicon-on-insulator nanostructure revealed by 3D x-ray Bragg ptychography
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Strain Imaging of Nanoscale Semiconductor Heterostructures with X-Ray Bragg Projection Ptychography
journal, April 2014

Efficient subpixel image registration algorithms
journal, January 2008

High-throughput ptychography using Eiger-scanning X-ray nano-imaging of extended regions
journal, January 2014

Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography
journal, September 2012

Strain Effects on the Crystal Growth and Superconducting Properties of Epitaxial Niobium Ultrathin Films
journal, March 2012

High-resolution ab initio three-dimensional x-ray diffraction microscopy
journal, January 2006

Ptychographic coherent diffractive imaging with orthogonal probe relaxation
journal, January 2016

Evolutionary determination of experimental parameters for ptychographical imaging
journal, June 2011

X-ray phase nanotomography through ptychographic coherent lensless imaging
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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography
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Chemical composition mapping with nanometre resolution by soft X-ray microscopy
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An annealing algorithm to correct positioning errors in ptychography
journal, September 2012

High-resolution projection image reconstruction of thick objects by hard x-ray diffraction microscopy
journal, December 2010

Translation position determination in ptychographic coherent diffraction imaging
journal, January 2013

Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray Diffraction
journal, October 2001

Commensurate and incommensurate structures in molecular beam epitaxially grown Ge _x Si ₁ _{− x} films on Si(100)
journal, August 1984

Three-dimensional high-resolution quantitative microscopy of extended crystals
journal, September 2011

Nondestructive three-dimensional imaging of crystal strain and rotations in an extended bonded semiconductor heterostructure
journal, November 2015

Constraints on the growth of metallic superlattices
journal, September 1988

Probe retrieval in ptychographic coherent diffractive imaging
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journal, July 2007

Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films
journal, October 2016

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X-ray ptychography on low-dimensional hard-condensed matter materials
journal, March 2019