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Title: Etching of Cr tips for scanning tunneling microscopy of cleavable oxides

Abstract

Here, we report a detailed three-step roadmap for the fabrication and characterization of bulk Cr tips for spin-polarized scanning tunneling microscopy. Our strategy uniquely circumvents the need for ultra-high vacuum preparation of clean surfaces or films. First, we demonstrate the role of ex situ electrochemical etch parameters on Cr tip apex geometry, using scanning electron micrographs of over 70 etched tips. Second, we describe the suitability of the in situ cleaved surface of the layered antiferromagnet La1.4Sr1.6Mn2O7 to evaluate the spin characteristics of the Cr tip, replacing the ultra-high vacuum-prepared test samples that have been used in prior studies. Third, we outline a statistical algorithm that can effectively delineate closely spaced or irregular cleaved step edges, to maximize the accuracy of step height and spin-polarization measurements.

Authors:
 [1];  [1];  [2]; ORCiD logo [3]; ORCiD logo [1]
+ Show Author Affiliations
  1. Harvard Univ., Cambridge, MA (United States)
  2. Harvard Univ., Cambridge, MA (United States); Boston College, Chestnut Hill, MA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); Materials Sciences and Engineering Division; National Science Foundation (NSF); Natural Sciences and Engineering Research Council of Canada (NSERC)
OSTI Identifier:
1352529
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Huang, Dennis, Liu, Stephen, Zeljkovic, Ilija, Mitchell, J. F., and Hoffman, Jennifer E. Etching of Cr tips for scanning tunneling microscopy of cleavable oxides. United States: N. p., 2017. Web. doi:10.1063/1.4976567.
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Huang, Dennis, Liu, Stephen, Zeljkovic, Ilija, Mitchell, J. F., & Hoffman, Jennifer E. Etching of Cr tips for scanning tunneling microscopy of cleavable oxides. United States. https://doi.org/10.1063/1.4976567
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Huang, Dennis, Liu, Stephen, Zeljkovic, Ilija, Mitchell, J. F., and Hoffman, Jennifer E. Tue . "Etching of Cr tips for scanning tunneling microscopy of cleavable oxides". United States. https://doi.org/10.1063/1.4976567. https://www.osti.gov/servlets/purl/1352529.
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@article{osti_1352529,
title = {Etching of Cr tips for scanning tunneling microscopy of cleavable oxides},
author = {Huang, Dennis and Liu, Stephen and Zeljkovic, Ilija and Mitchell, J. F. and Hoffman, Jennifer E.},
abstractNote = {Here, we report a detailed three-step roadmap for the fabrication and characterization of bulk Cr tips for spin-polarized scanning tunneling microscopy. Our strategy uniquely circumvents the need for ultra-high vacuum preparation of clean surfaces or films. First, we demonstrate the role of ex situ electrochemical etch parameters on Cr tip apex geometry, using scanning electron micrographs of over 70 etched tips. Second, we describe the suitability of the in situ cleaved surface of the layered antiferromagnet La1.4Sr1.6Mn2O7 to evaluate the spin characteristics of the Cr tip, replacing the ultra-high vacuum-prepared test samples that have been used in prior studies. Third, we outline a statistical algorithm that can effectively delineate closely spaced or irregular cleaved step edges, to maximize the accuracy of step height and spin-polarization measurements.},
doi = {10.1063/1.4976567},
journal = {Review of Scientific Instruments},
number = 2,
volume = 88,
place = {United States},
year = {Tue Feb 21 00:00:00 EST 2017},
month = {Tue Feb 21 00:00:00 EST 2017}
}
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https://doi.org/10.1063/1.4976567
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    Works referencing / citing this record:

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