Holders for in situ treatments of scanning tunneling microscopy tips

Journal Article · Tue Sep 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3223974· OSTI ID:22051040

Ishida, Nobuyuki; Subagyo, Agus; Ikeuchi, Akira; Sueoka, Kazuhisa ^[1]

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1. Graduate School of Information Science and Technology, Hokkaido University, Kita-14, Nishi-9, Kita-ku, Sapporo 060-0814 (Japan)

We have developed holders for scanning tunneling microscopy tips that can be used for in situ treatments of the tips, such as electron bombardment (EB) heating, ion sputtering, and the coating of magnetic materials. The holders can be readily installed into the transfer paths and do not require any special type of base stages. Scanning electron microscopy is used to characterize the tip apex after EB heating. Also, spin-polarized scanning tunneling spectroscopy using an Fe coated W tip on the Cr(001) single crystal surface is performed in order to confirm both the capability of heating a tip up to about 2200 K and the spin sensitivity of the magnetically coated tip.

• OSTI ID: 22051040
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 9; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHROMIUM
ELECTRON BEAMS
HEAT TREATMENTS
HEATING
IRON
MAGNETIC MATERIALS
MONOCRYSTALS
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY
SENSITIVITY
SPECTROSCOPY
SPIN ORIENTATION
SPUTTERING
SURFACE COATING
THIN FILMS
TUNGSTEN