Representational analysis of extended disorder in atomistic ensembles derived from total scattering data
Abstract
With the increased availability of high-intensity time-of-flight neutron and synchrotron X-ray scattering sources that can access wide ranges of momentum transfer, the pair distribution function method has become a standard analysis technique for studying disorder of local coordination spheres and at intermediate atomic separations. In some cases, rational modeling of the total scattering data (Bragg and diffuse) becomes intractable with least-squares approaches, necessitating reverse Monte Carlo simulations using large atomistic ensembles. However, the extraction of meaningful information from the resulting atomistic ensembles is challenging, especially at intermediate length scales. Representational analysis is used here to describe the displacements of atoms in reverse Monte Carlo ensembles from an ideal crystallographic structure in an approach analogous to tight-binding methods. Rewriting the displacements in terms of a local basis that is descriptive of the ideal crystallographic symmetry provides a robust approach to characterizing medium-range order (and disorder) and symmetry breaking in complex and disordered crystalline materials. Lastly, this method enables the extraction of statistically relevant displacement modes (orientation, amplitude and distribution) of the crystalline disorder and provides directly meaningful information in a locally symmetry-adapted basis set that is most descriptive of the crystal chemistry and physics.
- Authors:
-
- Colorado State Univ., Fort Collins, CO (United States). Dept. of Chemistry
- Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Chemistry, Materials Science and Engineering, and Physics and Astronomy
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1344885
- Grant/Contract Number:
- FG02-08ER46544; AC52-06NA25396
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Crystallography (Online)
- Additional Journal Information:
- Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 48; Journal Issue: 5; Journal ID: ISSN 1600-5767
- Publisher:
- International Union of Crystallography
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; extended disorder; atomistic ensembles; modeling; pair distribution function analysis
Citation Formats
Neilson, James R., and McQueen, Tyrel M. Representational analysis of extended disorder in atomistic ensembles derived from total scattering data. United States: N. p., 2015.
Web. doi:10.1107/s1600576715016404.
Neilson, James R., & McQueen, Tyrel M. Representational analysis of extended disorder in atomistic ensembles derived from total scattering data. United States. https://doi.org/10.1107/s1600576715016404
Neilson, James R., and McQueen, Tyrel M. Sun .
"Representational analysis of extended disorder in atomistic ensembles derived from total scattering data". United States. https://doi.org/10.1107/s1600576715016404. https://www.osti.gov/servlets/purl/1344885.
@article{osti_1344885,
title = {Representational analysis of extended disorder in atomistic ensembles derived from total scattering data},
author = {Neilson, James R. and McQueen, Tyrel M.},
abstractNote = {With the increased availability of high-intensity time-of-flight neutron and synchrotron X-ray scattering sources that can access wide ranges of momentum transfer, the pair distribution function method has become a standard analysis technique for studying disorder of local coordination spheres and at intermediate atomic separations. In some cases, rational modeling of the total scattering data (Bragg and diffuse) becomes intractable with least-squares approaches, necessitating reverse Monte Carlo simulations using large atomistic ensembles. However, the extraction of meaningful information from the resulting atomistic ensembles is challenging, especially at intermediate length scales. Representational analysis is used here to describe the displacements of atoms in reverse Monte Carlo ensembles from an ideal crystallographic structure in an approach analogous to tight-binding methods. Rewriting the displacements in terms of a local basis that is descriptive of the ideal crystallographic symmetry provides a robust approach to characterizing medium-range order (and disorder) and symmetry breaking in complex and disordered crystalline materials. Lastly, this method enables the extraction of statistically relevant displacement modes (orientation, amplitude and distribution) of the crystalline disorder and provides directly meaningful information in a locally symmetry-adapted basis set that is most descriptive of the crystal chemistry and physics.},
doi = {10.1107/s1600576715016404},
journal = {Journal of Applied Crystallography (Online)},
number = 5,
volume = 48,
place = {United States},
year = {Sun Sep 20 00:00:00 EDT 2015},
month = {Sun Sep 20 00:00:00 EDT 2015}
}
Web of Science
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