Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs

Tonfat, Jorge; Lima Kastensmidt, Fernanda; Rech, Paolo; Reis, Ricardo; Quinn, Heather Marie

doi:10.1109/TNS.2015.2489601

Title: Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs

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Abstract

Radiation effects such as soft errors are the major threat to the reliability of SRAM-based FPGAs. This work analyzes the effectiveness in correcting soft errors of a novel scrubbing technique using internal frame redundancy called Frame-level Redundancy Scrubbing (FLR-scrubbing). This correction technique can be implemented in a coarse grain TMR design. The FLR-scrubbing technique was implemented on a mid-size Xilinx Virtex-5 FPGA device used as a case study. The FLR-scrubbing technique was tested under neutron radiation and fault injection. Implementation results demonstrated minimum area and energy consumption overhead when compared to other techniques. The time to repair the fault is also improved by using the Internal Configuration Access Port (ICAP). Lastly, neutron radiation test results demonstrated that the proposed technique is suitable for correcting accumulated SEUs and MBUs.

Authors:

Tonfat, Jorge ^[1]; Lima Kastensmidt, Fernanda ^[1]; Rech, Paolo ^[1]; Reis, Ricardo ^[1]; Quinn, Heather Marie ^[2]

PGMICRO, UFRGS, Porto Alegre (Brazil)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Publication Date:: Thu Dec 17 00:00:00 EST 2015

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1334144

Report Number(s):: LA-UR-15-27806
Journal ID: ISSN 0018-9499

Grant/Contract Number:: AC52-06NA25396

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 62; Journal Issue: 6; Journal ID: ISSN 0018-9499

Publisher:: Institute of Electrical and Electronics Engineers (IEEE)

Country of Publication:: United States

Language:: English

Subject:: 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; radiation effects; fault tolerance; field programmable gate arrays

Citation Formats


                    Tonfat, Jorge, Lima Kastensmidt, Fernanda, Rech, Paolo, Reis, Ricardo, and Quinn, Heather Marie. Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs.  United States: N. p., 2015. 
Web.  doi:10.1109/TNS.2015.2489601.

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                    Tonfat, Jorge, Lima Kastensmidt, Fernanda, Rech, Paolo, Reis, Ricardo, & Quinn, Heather Marie. Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs.  United States.  https://doi.org/10.1109/TNS.2015.2489601

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                    Tonfat, Jorge, Lima Kastensmidt, Fernanda, Rech, Paolo, Reis, Ricardo, and Quinn, Heather Marie. Thu .  
"Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs".  United States.  https://doi.org/10.1109/TNS.2015.2489601.  https://www.osti.gov/servlets/purl/1334144.

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@article{osti_1334144,

  title        = {Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs},

  author       = {Tonfat, Jorge and Lima Kastensmidt, Fernanda and Rech, Paolo and Reis, Ricardo and Quinn, Heather Marie},

  abstractNote = {Radiation effects such as soft errors are the major threat to the reliability of SRAM-based FPGAs. This work analyzes the effectiveness in correcting soft errors of a novel scrubbing technique using internal frame redundancy called Frame-level Redundancy Scrubbing (FLR-scrubbing). This correction technique can be implemented in a coarse grain TMR design. The FLR-scrubbing technique was implemented on a mid-size Xilinx Virtex-5 FPGA device used as a case study. The FLR-scrubbing technique was tested under neutron radiation and fault injection. Implementation results demonstrated minimum area and energy consumption overhead when compared to other techniques. The time to repair the fault is also improved by using the Internal Configuration Access Port (ICAP). Lastly, neutron radiation test results demonstrated that the proposed technique is suitable for correcting accumulated SEUs and MBUs.},

  doi          = {10.1109/TNS.2015.2489601},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 6,

  volume       = 62,

  place        = {United States},

  year         = {Thu Dec 17 00:00:00 EST 2015},

  month        = {Thu Dec 17 00:00:00 EST 2015}

}

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