DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Design and demonstration of ultra-wide bandgap AlGaN tunnel junctions

Abstract

Ultra violet light emitting diodes (UV LEDs) face critical limitations in both the injection efficiency and the light extraction efficiency due to the resistive and absorbing p-type contact layers. In this work, we investigate the design and application of polarization engineered tunnel junctions for ultra-wide bandgap AlGaN (Al mole fraction >50%) materials towards highly efficient UV LEDs. We demonstrate that polarization-induced three dimensional charge is beneficial in reducing tunneling barriers especially for high composition AlGaN tunnel junctions. In addition, the design of graded tunnel junction structures could lead to low tunneling resistance below 10–3 Ω cm2 and low voltage consumption below 1 V (at 1 kA/cm2) for high composition AlGaN tunnel junctions. Experimental demonstration of 292 nm emission was achieved through non-equilibrium hole injection into wide bandgap materials with bandgap energy larger than 4.7 eV, and detailed modeling of tunnel junctions shows that they can be engineered to have low resistance and can enable efficient emitters in the UV-C wavelength range.

Authors:
ORCiD logo [1];  [1];  [1];  [2];  [2];  [2];  [1]
  1. The Ohio State Univ., Columbus, OH (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1333538
Alternate Identifier(s):
OSTI ID: 1328480
Report Number(s):
SAND-2016-9079J
Journal ID: ISSN 0003-6951; APPLAB; 647379; TRN: US1700180
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 109; Journal Issue: 12; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; tunnel junctions; tunneling; III-V semiconductors; light emitting diodes; ultraviolet light

Citation Formats

Zhang, Yuewei, Krishnamoorthy, Sriram, Akyol, Fatih, Allerman, Andrew A., Moseley, Michael W., Armstrong, Andrew M., and Rajan, Siddharth. Design and demonstration of ultra-wide bandgap AlGaN tunnel junctions. United States: N. p., 2016. Web. doi:10.1063/1.4962900.
Zhang, Yuewei, Krishnamoorthy, Sriram, Akyol, Fatih, Allerman, Andrew A., Moseley, Michael W., Armstrong, Andrew M., & Rajan, Siddharth. Design and demonstration of ultra-wide bandgap AlGaN tunnel junctions. United States. https://doi.org/10.1063/1.4962900
Zhang, Yuewei, Krishnamoorthy, Sriram, Akyol, Fatih, Allerman, Andrew A., Moseley, Michael W., Armstrong, Andrew M., and Rajan, Siddharth. Mon . "Design and demonstration of ultra-wide bandgap AlGaN tunnel junctions". United States. https://doi.org/10.1063/1.4962900. https://www.osti.gov/servlets/purl/1333538.
@article{osti_1333538,
title = {Design and demonstration of ultra-wide bandgap AlGaN tunnel junctions},
author = {Zhang, Yuewei and Krishnamoorthy, Sriram and Akyol, Fatih and Allerman, Andrew A. and Moseley, Michael W. and Armstrong, Andrew M. and Rajan, Siddharth},
abstractNote = {Ultra violet light emitting diodes (UV LEDs) face critical limitations in both the injection efficiency and the light extraction efficiency due to the resistive and absorbing p-type contact layers. In this work, we investigate the design and application of polarization engineered tunnel junctions for ultra-wide bandgap AlGaN (Al mole fraction >50%) materials towards highly efficient UV LEDs. We demonstrate that polarization-induced three dimensional charge is beneficial in reducing tunneling barriers especially for high composition AlGaN tunnel junctions. In addition, the design of graded tunnel junction structures could lead to low tunneling resistance below 10–3 Ω cm2 and low voltage consumption below 1 V (at 1 kA/cm2) for high composition AlGaN tunnel junctions. Experimental demonstration of 292 nm emission was achieved through non-equilibrium hole injection into wide bandgap materials with bandgap energy larger than 4.7 eV, and detailed modeling of tunnel junctions shows that they can be engineered to have low resistance and can enable efficient emitters in the UV-C wavelength range.},
doi = {10.1063/1.4962900},
journal = {Applied Physics Letters},
number = 12,
volume = 109,
place = {United States},
year = {Mon Sep 19 00:00:00 EDT 2016},
month = {Mon Sep 19 00:00:00 EDT 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 23 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Efficiency droop in InGaN/GaN blue light-emitting diodes: Physical mechanisms and remedies
journal, August 2013

  • Verzellesi, Giovanni; Saguatti, Davide; Meneghini, Matteo
  • Journal of Applied Physics, Vol. 114, Issue 7
  • DOI: 10.1063/1.4816434

Low resistance GaN/InGaN/GaN tunnel junctions
journal, March 2013

  • Krishnamoorthy, Sriram; Akyol, Fatih; Park, Pil Sung
  • Applied Physics Letters, Vol. 102, Issue 11
  • DOI: 10.1063/1.4796041

Effect of heterostructure design on carrier injection and emission characteristics of 295 nm light emitting diodes
journal, May 2015

  • Mehnke, Frank; Kuhn, Christian; Stellmach, Joachim
  • Journal of Applied Physics, Vol. 117, Issue 19
  • DOI: 10.1063/1.4921439

Polarization-Induced Hole Doping in Wide-Band-Gap Uniaxial Semiconductor Heterostructures
journal, December 2009


Multi-color light emitting diode using polarization-induced tunnel junctions
journal, June 2007

  • Grundmann, Michael J.; Mishra, Umesh K.
  • physica status solidi (c), Vol. 4, Issue 7
  • DOI: 10.1002/pssc.200675000

Electron gas dimensionality engineering in AlGaN/GaN high electron mobility transistors using polarization
journal, February 2012

  • Sung Park, Pil; Nath, Digbijoy N.; Krishnamoorthy, Sriram
  • Applied Physics Letters, Vol. 100, Issue 6
  • DOI: 10.1063/1.3685483

Improved injection efficiency in 290 nm light emitting diodes with Al(Ga)N electron blocking heterostructure
journal, July 2013

  • Kolbe, T.; Mehnke, F.; Guttmann, M.
  • Applied Physics Letters, Vol. 103, Issue 3
  • DOI: 10.1063/1.4813859

Interband tunneling for hole injection in III-nitride ultraviolet emitters
journal, April 2015

  • Zhang, Yuewei; Krishnamoorthy, Sriram; Johnson, Jared M.
  • Applied Physics Letters, Vol. 106, Issue 14
  • DOI: 10.1063/1.4917529

AlGaN/GaN polarization-doped field-effect transistor for microwave power applications
journal, March 2004

  • Rajan, Siddharth; Xing, Huili; DenBaars, Steve
  • Applied Physics Letters, Vol. 84, Issue 9
  • DOI: 10.1063/1.1652254

InGaN based micro light emitting diodes featuring a buried GaN tunnel junction
journal, August 2015

  • Malinverni, M.; Martin, D.; Grandjean, N.
  • Applied Physics Letters, Vol. 107, Issue 5
  • DOI: 10.1063/1.4928037

Lateral current spreading in GaN-based light-emitting diodes utilizing tunnel contact junctions
journal, May 2001

  • Jeon, Seong-Ran; Song, Young-Ho; Jang, Ho-Jin
  • Applied Physics Letters, Vol. 78, Issue 21
  • DOI: 10.1063/1.1374483

High power AlGaN ultraviolet light emitters
journal, June 2014


Tunneling-based carrier regeneration in cascaded GaN light emitting diodes to overcome efficiency droop
journal, August 2013

  • Akyol, Fatih; Krishnamoorthy, Sriram; Rajan, Siddharth
  • Applied Physics Letters, Vol. 103, Issue 8
  • DOI: 10.1063/1.4819737

Si-doped AlxGa1−xN(0.56⩽×⩽1) layers grown by molecular beam epitaxy with ammonia
journal, September 2005

  • Borisov, B.; Kuryatkov, V.; Kudryavtsev, Yu.
  • Applied Physics Letters, Vol. 87, Issue 13
  • DOI: 10.1063/1.2061856

Room-temperature direct current operation of 290 nm light-emitting diodes with milliwatt power levels
journal, April 2004

  • Fischer, A. J.; Allerman, A. A.; Crawford, M. H.
  • Applied Physics Letters, Vol. 84, Issue 17
  • DOI: 10.1063/1.1728307

Mg acceptor level in AlN probed by deep ultraviolet photoluminescence
journal, August 2003

  • Nam, K. B.; Nakarmi, M. L.; Li, J.
  • Applied Physics Letters, Vol. 83, Issue 5
  • DOI: 10.1063/1.1594833

Low-resistance GaN tunnel homojunctions with 150 kA/cm 2 current and repeatable negative differential resistance
journal, March 2016

  • Akyol, Fatih; Krishnamoorthy, Sriram; Zhang, Yuewei
  • Applied Physics Letters, Vol. 108, Issue 13
  • DOI: 10.1063/1.4944998

Alternating-Current InGaN/GaN Tunnel Junction Nanowire White-Light Emitting Diodes
journal, September 2015


AlGaN Deep-Ultraviolet Light-Emitting Diodes with External Quantum Efficiency above 10%
journal, July 2012

  • Shatalov, Max; Sun, Wenhong; Lunev, Alex
  • Applied Physics Express, Vol. 5, Issue 8
  • DOI: 10.1143/APEX.5.082101

270 nm Pseudomorphic Ultraviolet Light-Emitting Diodes with Over 60 mW Continuous Wave Output Power
journal, March 2013

  • Grandusky, James R.; Chen, Jianfeng; Gibb, Shawn R.
  • Applied Physics Express, Vol. 6, Issue 3
  • DOI: 10.7567/APEX.6.032101

Recent progress and future prospects of AlGaN-based high-efficiency deep-ultraviolet light-emitting diodes
journal, September 2014

  • Hirayama, Hideki; Maeda, Noritoshi; Fujikawa, Sachie
  • Japanese Journal of Applied Physics, Vol. 53, Issue 10
  • DOI: 10.7567/JJAP.53.100209

Enhanced light extraction in 260 nm light-emitting diode with a highly transparent p-AlGaN layer
journal, December 2015

  • Jo, Masafumi; Maeda, Noritoshi; Hirayama, Hideki
  • Applied Physics Express, Vol. 9, Issue 1
  • DOI: 10.7567/APEX.9.012102

Enhanced light extraction in tunnel junction-enabled top emitting UV LEDs
journal, April 2016

  • Zhang, Yuewei; Allerman, Andrew A.; Krishnamoorthy, Sriram
  • Applied Physics Express, Vol. 9, Issue 5
  • DOI: 10.7567/APEX.9.052102

Thomas-Fermi Approach to Impure Semiconductor Band Structure
journal, July 1963


Multijunction GaInN-based solar cells using a tunnel junction
journal, March 2014

  • Kurokawa, Hironori; Kaga, Mitsuru; Goda, Tomomi
  • Applied Physics Express, Vol. 7, Issue 3
  • DOI: 10.7567/APEX.7.034104

GaN-based three-junction cascaded light-emitting diode with low-resistance InGaN tunnel junctions
journal, July 2015

  • Akyol, Fatih; Krishnamoorthy, Sriram; Zhang, Yuewei
  • Applied Physics Express, Vol. 8, Issue 8
  • DOI: 10.7567/APEX.8.082103

Hybrid tunnel junction contacts to III–nitride light-emitting diodes
journal, January 2016

  • Young, Erin C.; Yonkee, Benjamin P.; Wu, Feng
  • Applied Physics Express, Vol. 9, Issue 2
  • DOI: 10.7567/APEX.9.022102

Investigation of Light Extraction Efficiency in AlGaN Deep-Ultraviolet Light-Emitting Diodes
journal, June 2013

  • Ryu, Han-Youl; Choi, Il-Gyun; Choi, Hyo-Sik
  • Applied Physics Express, Vol. 6, Issue 6
  • DOI: 10.7567/APEX.6.062101

RF-Molecular Beam Epitaxy Growth and Properties of InN and Related Alloys
journal, May 2003

  • Nanishi, Yasushi; Saito, Yoshiki; Yamaguchi, Tomohiro
  • Japanese Journal of Applied Physics, Vol. 42, Issue Part 1, No. 5A
  • DOI: 10.1143/JJAP.42.2549

Robust 290 nm Emission Light Emitting Diodes over Pulsed Laterally Overgrown AlN
journal, September 2007

  • Adivarahan, Vinod; Fareed, Qhalid; Islam, Monirul
  • Japanese Journal of Applied Physics, Vol. 46, Issue No. 36
  • DOI: 10.1143/JJAP.46.L877

Works referencing / citing this record:

Design of AlGaN-based lasers with a buried tunnel junction for sub-300 nm emission
journal, June 2019

  • Arafin, Shamsul; Hasan, Syed M. N.; Jamal-Eddine, Zane
  • Semiconductor Science and Technology, Vol. 34, Issue 7
  • DOI: 10.1088/1361-6641/ab19cd

Nanoscale current uniformity and injection efficiency of nanowire light emitting diodes
journal, February 2018

  • May, Brelon J.; Selcu, Camelia M.; Sarwar, A. T. M. G.
  • Applied Physics Letters, Vol. 112, Issue 9
  • DOI: 10.1063/1.5020734

Ge doped GaN and Al 0.5 Ga 0.5 N-based tunnel junctions on top of visible and UV light emitting diodes
journal, December 2019

  • Fan Arcara, V.; Damilano, B.; Feuillet, G.
  • Journal of Applied Physics, Vol. 126, Issue 22
  • DOI: 10.1063/1.5121379

Tunnel-injected sub 290 nm ultra-violet light emitting diodes with 2.8% external quantum efficiency
journal, February 2018

  • Zhang, Yuewei; Jamal-Eddine, Zane; Akyol, Fatih
  • Applied Physics Letters, Vol. 112, Issue 7
  • DOI: 10.1063/1.5017045

Ultra-wide-bandgap AlGaN homojunction tunnel diodes with negative differential resistance
journal, August 2019

  • Clinton, Evan A.; Engel, Zachary; Vadiee, Ehsan
  • Applied Physics Letters, Vol. 115, Issue 8
  • DOI: 10.1063/1.5113503

Tunnel-injected sub-260 nm ultraviolet light emitting diodes
journal, May 2017

  • Zhang, Yuewei; Krishnamoorthy, Sriram; Akyol, Fatih
  • Applied Physics Letters, Vol. 110, Issue 20
  • DOI: 10.1063/1.4983352

AlGaN nanocrystals: building blocks for efficient ultraviolet optoelectronics
journal, January 2019

  • Liu, Xianhe; Mashooq, Kishwar; Laleyan, David A.
  • Photonics Research, Vol. 7, Issue 6
  • DOI: 10.1364/prj.7.000b12

Progress in External Quantum Efficiency for III-Nitride Based Deep Ultraviolet Light-Emitting Diodes
journal, January 2019

  • Chu, Chunshuang; Tian, Kangkai; Zhang, Yonghui
  • physica status solidi (a), Vol. 216, Issue 4
  • DOI: 10.1002/pssa.201800815

Fabrication technology for high light-extraction ultraviolet thin-film flip-chip (UV TFFC) LEDs grown on SiC
journal, January 2019

  • SaifAddin, Burhan K.; Almogbel, Abdullah; Zollner, Christian J.
  • Semiconductor Science and Technology, Vol. 34, Issue 3
  • DOI: 10.1088/1361-6641/aaf58f

Tunnel-injected sub-260 nm ultraviolet light emitting diodes
text, January 2017


Fabrication technology for high light-extraction ultraviolet thin-film flip-chip (UV TFFC) LEDs grown on SiC
preprint, January 2018