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Title: Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions

Abstract

Molecular dynamics simulations were used to study Ge island nucleation and growth on amorphous SiO2 substrates. This process is relevant in selective epitaxial growth of Ge on Si, for which SiO2 is often used as a template mask. The islanding process was studied over a wide range of temperatures and fluxes, using a recently proposed empirical potential model for the Si–SiO2–Ge system. The simulations provide an excellent quantitative picture of the Ge islanding and compare well with detailed experimental measurements. These quantitative comparisons were enabled by an analytical rate model as a bridge between simulations and experiments despite the fact that deposition fluxes accessible in simulations and experiments are necessarily different by many orders of magnitude. In particular, the simulations led to accurate predictions of the critical island size and the scaling of island density as a function of temperature. Lastly, the overall approach used here should be useful not just for future studies in this particular system, but also for molecular simulations of deposition in other materials.

Authors:
 [1];  [2];  [3];  [1]
  1. Univ. of Pennsylvania, Philadelphia, PA (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Univ. of New Mexico, Albuquerque, NM (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1342000
Alternate Identifier(s):
OSTI ID: 1244741
Report Number(s):
LLNL-JRNL-694161
Journal ID: ISSN 0039-6028
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Surface Science
Additional Journal Information:
Journal Volume: 641; Journal Issue: C; Journal ID: ISSN 0039-6028
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; molecular dynamics; atomic deposition; amorphous SiO2; germanium; silicon

Citation Formats

Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., and Sinno, Talid. Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions. United States: N. p., 2015. Web. doi:10.1016/j.susc.2015.04.029.
Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., & Sinno, Talid. Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions. United States. https://doi.org/10.1016/j.susc.2015.04.029
Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., and Sinno, Talid. Mon . "Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions". United States. https://doi.org/10.1016/j.susc.2015.04.029. https://www.osti.gov/servlets/purl/1342000.
@article{osti_1342000,
title = {Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions},
author = {Chuang, Claire Y. and Zepeda-Ruiz, Luis A. and Han, Sang M. and Sinno, Talid},
abstractNote = {Molecular dynamics simulations were used to study Ge island nucleation and growth on amorphous SiO2 substrates. This process is relevant in selective epitaxial growth of Ge on Si, for which SiO2 is often used as a template mask. The islanding process was studied over a wide range of temperatures and fluxes, using a recently proposed empirical potential model for the Si–SiO2–Ge system. The simulations provide an excellent quantitative picture of the Ge islanding and compare well with detailed experimental measurements. These quantitative comparisons were enabled by an analytical rate model as a bridge between simulations and experiments despite the fact that deposition fluxes accessible in simulations and experiments are necessarily different by many orders of magnitude. In particular, the simulations led to accurate predictions of the critical island size and the scaling of island density as a function of temperature. Lastly, the overall approach used here should be useful not just for future studies in this particular system, but also for molecular simulations of deposition in other materials.},
doi = {10.1016/j.susc.2015.04.029},
journal = {Surface Science},
number = C,
volume = 641,
place = {United States},
year = {Mon Jun 01 00:00:00 EDT 2015},
month = {Mon Jun 01 00:00:00 EDT 2015}
}

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Works referenced in this record:

High performance, waveguide integrated Ge photodetectors
journal, January 2007

  • Ahn, Donghwan; Hong, Ching-yin; Liu, Jifeng
  • Optics Express, Vol. 15, Issue 7
  • DOI: 10.1364/OE.15.003916

High-performance Ge-on-Si photodetectors
journal, July 2010


Germanium MOSFET Devices: Advances in Materials Understanding, Process Development, and Electrical Performance
journal, May 2008

  • Brunco, D. P.; De Jaeger, B.; Eneman, G.
  • Journal of The Electrochemical Society, Vol. 155, Issue 7, p. H552-H561
  • DOI: 10.1149/1.2919115

High-k/Ge MOSFETs for future nanoelectronics
journal, January 2008


Germanium and Silicon Nanocrystal Thin-Film Field-Effect Transistors from Solution
journal, July 2010

  • Holman, Zachary C.; Liu, Chin-Yi; Kortshagen, Uwe R.
  • Nano Letters, Vol. 10, Issue 7
  • DOI: 10.1021/nl101413d

Mobility characterization of Ge-on-insulator metal-oxide-semiconductor field-effect transistors with striped Ge channels fabricated by lateral liquid-phase epitaxy
journal, October 2014

  • Hosoi, Takuji; Suzuki, Yuichiro; Shimura, Takayoshi
  • Applied Physics Letters, Vol. 105, Issue 17
  • DOI: 10.1063/1.4900442

Development and characterization of high-efficiency Ga/sub 0.5/In/sub 0.5/P/GaAs/Ge dual- and triple-junction solar cells
journal, January 1999

  • Karam, N. H.; King, R. R.; Cavicchi, B. T.
  • IEEE Transactions on Electron Devices, Vol. 46, Issue 10
  • DOI: 10.1109/16.792006

Investigations of High-Performance GaAs Solar Cells Grown on Ge–Si<tex>$_1-xhbox Ge_ x$</tex>–Si Substrates
journal, June 2005

  • Andre, C. L.; Carlin, J. A.; Boeckl, J. J.
  • IEEE Transactions on Electron Devices, Vol. 52, Issue 6
  • DOI: 10.1109/TED.2005.848117

40% efficient metamorphic GaInP∕GaInAs∕Ge multijunction solar cells
journal, April 2007

  • King, R. R.; Law, D. C.; Edmondson, K. M.
  • Applied Physics Letters, Vol. 90, Issue 18
  • DOI: 10.1063/1.2734507

Fabrication and analysis of multijunction solar cells with a quantum dot (In)GaAs junction: Fabrication and analysis of multijunction QD solar cells
journal, April 2013

  • Kerestes, Christopher; Polly, Stephen; Forbes, David
  • Progress in Photovoltaics: Research and Applications, Vol. 22, Issue 11
  • DOI: 10.1002/pip.2378

Calculation of critical layer thickness versus lattice mismatch for Ge x Si 1− x /Si strained‐layer heterostructures
journal, August 1985

  • People, R.; Bean, J. C.
  • Applied Physics Letters, Vol. 47, Issue 3
  • DOI: 10.1063/1.96206

Controlling threading dislocation densities in Ge on Si using graded SiGe layers and chemical-mechanical polishing
journal, April 1998

  • Currie, M. T.; Samavedam, S. B.; Langdo, T. A.
  • Applied Physics Letters, Vol. 72, Issue 14
  • DOI: 10.1063/1.121162

High-quality Ge epilayers on Si with low threading-dislocation densities
journal, November 1999

  • Luan, Hsin-Chiao; Lim, Desmond R.; Lee, Kevin K.
  • Applied Physics Letters, Vol. 75, Issue 19
  • DOI: 10.1063/1.125187

New approach to the high quality epitaxial growth of lattice‐mismatched materials
journal, July 1986

  • Luryi, Serge; Suhir, Ephraim
  • Applied Physics Letters, Vol. 49, Issue 3
  • DOI: 10.1063/1.97204

High quality Ge on Si by epitaxial necking
journal, June 2000

  • Langdo, T. A.; Leitz, C. W.; Currie, M. T.
  • Applied Physics Letters, Vol. 76, Issue 25
  • DOI: 10.1063/1.126754

Selective growth of Ge on Si(100) through vias of SiO2 nanotemplate using solid source molecular beam epitaxy
journal, December 2003

  • Li, Qiming; Han, Sang M.; Brueck, Steven R. J.
  • Applied Physics Letters, Vol. 83, Issue 24
  • DOI: 10.1063/1.1632037

Heteroepitaxy of high-quality Ge on Si by nanoscale Ge seeds grown through a thin layer of SiO2
journal, September 2004

  • Li, Qiming; Jiang, Ying-Bing; Xu, Huifang
  • Applied Physics Letters, Vol. 85, Issue 11
  • DOI: 10.1063/1.1790027

Origin and removal of stacking faults in Ge islands nucleated on Si within nanoscale openings in SiO 2
journal, October 2011

  • Leonhardt, Darin; Ghosh, Swapnadip; Han, Sang M.
  • Journal of Applied Physics, Vol. 110, Issue 7
  • DOI: 10.1063/1.3643003

Energetics of Ge nucleation on SiO2 and implications for selective epitaxial growth
journal, August 2009


Atomistic analysis of Ge on amorphous SiO2 using an empirical interatomic potential
journal, March 2013


A new algorithm for Monte Carlo simulation of Ising spin systems
journal, January 1975


Theoretical foundations of dynamical Monte Carlo simulations
journal, July 1991

  • Fichthorn, Kristen A.; Weinberg, W. H.
  • The Journal of Chemical Physics, Vol. 95, Issue 2
  • DOI: 10.1063/1.461138

Lattice kinetic Monte Carlo simulations of defect evolution in crystals at elevated temperature
journal, March 2006


A lattice kinetic Monte Carlo study of void morphological evolution during silicon crystal growth
journal, August 2007


Coarse-grained lattice kinetic Monte Carlo simulation of systems of strongly interacting particles
journal, May 2008

  • Dai, Jianguo; Seider, Warren D.; Sinno, Talid
  • The Journal of Chemical Physics, Vol. 128, Issue 19
  • DOI: 10.1063/1.2913241

Atomistic kinetic Monte Carlo study of atomic layer deposition derived from density functional theory
journal, November 2013

  • Shirazi, Mahdi; Elliott, Simon D.
  • Journal of Computational Chemistry, Vol. 35, Issue 3
  • DOI: 10.1002/jcc.23491

Dynamics of irreversible island growth during submonolayer epitaxy
journal, September 1994


Erratum to “Submonolayer epitaxy without a critical nucleus” [Surface Science 329 (1995) L599]
journal, September 1995


A kinetic Monte Carlo method for the atomic-scale simulation of chemical vapor deposition: Application to diamond
journal, December 1997

  • Battaile, C. C.; Srolovitz, D. J.; Butler, J. E.
  • Journal of Applied Physics, Vol. 82, Issue 12
  • DOI: 10.1063/1.366532

A Monte Carlo simulation of submonolayer homoepitaxial growth on Ag(110) and Cu(110)
journal, November 1998


Morphological evolution during epitaxial thin film growth: Formation of 2D islands and 3D mounds
journal, April 2006


Kinetic Monte Carlo simulation of 3-D growth of NiTi alloy thin films
journal, December 2014


Long time scale kinetic Monte Carlo simulations without lattice approximation and predefined event table
journal, December 2001

  • Henkelman, Graeme; Jónsson, Hannes
  • The Journal of Chemical Physics, Vol. 115, Issue 21
  • DOI: 10.1063/1.1415500

Self-evolving atomistic kinetic Monte Carlo: fundamentals and applications
journal, August 2012


Temperature-accelerated dynamics for simulation of infrequent events
journal, June 2000

  • So/rensen, Mads R.; Voter, Arthur F.
  • The Journal of Chemical Physics, Vol. 112, Issue 21
  • DOI: 10.1063/1.481576

Hyperdynamics: Accelerated Molecular Dynamics of Infrequent Events
journal, May 1997


Closing the Gap between Experiment and Theory: Crystal Growth by Temperature Accelerated Dynamics
journal, August 2001


Theory of thin film condensation. Part b: Solution of the simplified condensation equation
journal, December 1968


Nucleation of Vapor Deposits
journal, November 1962

  • Walton, D.
  • The Journal of Chemical Physics, Vol. 37, Issue 10
  • DOI: 10.1063/1.1732985

Nucleation kinetics in thin film growth
journal, July 1971


Rate equation approaches to thin film nucleation kinetics
journal, March 1973


Nucleation and growth of thin films
journal, April 1984

  • Venables, J. A.; Spiller, G. D. T.; Hanbucken, M.
  • Reports on Progress in Physics, Vol. 47, Issue 4
  • DOI: 10.1088/0034-4885/47/4/002

Nucleation on substrates from the vapour phase
journal, July 1970


Critical Cluster Size: Island Morphology and Size Distribution in Submonolayer Epitaxial Growth
journal, September 1995


Scaling functions for island-size distributions
journal, December 2000


Nucleation, adatom capture, and island size distributions: Unified scaling analysis for submonolayer deposition
journal, May 2001


Capture-Zone Scaling in Island Nucleation: Universal Fluctuation Behavior
journal, November 2007


Scaling and Exponent Equalities in Island Nucleation: Novel Results and Application to Organic Films
journal, March 2014

  • Pimpinelli, Alberto; Tumbek, Levent; Winkler, Adolf
  • The Journal of Physical Chemistry Letters, Vol. 5, Issue 6
  • DOI: 10.1021/jz500282t

Initial stages of Cu epitaxy on Ni(100): Postnucleation and a well-defined transition in critical island size
journal, December 1996


High-resolution LEED profile analysis and diffusion barrier estimation for submonolayer homoepitaxy of Ag/Ag(100)
journal, May 1998


Peculiar diffusion of C60 on In-adsorbed Si(111)√3×√3-Au surface
journal, October 2013


Pentacene thin films on ferromagnetic oxide: Growth mechanism and spintronic devices
journal, July 2014

  • Graziosi, P.; Riminucci, A.; Prezioso, M.
  • Applied Physics Letters, Vol. 105, Issue 2
  • DOI: 10.1063/1.4890328

Modeling solid-state chemistry: Interatomic potentials for multicomponent systems
journal, March 1989


Interatomic potential for Si–O systems using Tersoff parameterization
journal, April 2007


Fast Parallel Algorithms for Short-Range Molecular Dynamics
journal, March 1995


Rapid estimation of elastic constants by molecular dynamics simulation under constant stress
journal, April 2004


Visualization and analysis of atomistic simulation data with OVITO–the Open Visualization Tool
journal, December 2009


Growth of three-dimensional structures by atomic deposition on surfaces containing defects: simulations and theory
journal, September 1998