Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions
Abstract
Molecular dynamics simulations were used to study Ge island nucleation and growth on amorphous SiO2 substrates. This process is relevant in selective epitaxial growth of Ge on Si, for which SiO2 is often used as a template mask. The islanding process was studied over a wide range of temperatures and fluxes, using a recently proposed empirical potential model for the Si–SiO2–Ge system. The simulations provide an excellent quantitative picture of the Ge islanding and compare well with detailed experimental measurements. These quantitative comparisons were enabled by an analytical rate model as a bridge between simulations and experiments despite the fact that deposition fluxes accessible in simulations and experiments are necessarily different by many orders of magnitude. In particular, the simulations led to accurate predictions of the critical island size and the scaling of island density as a function of temperature. Lastly, the overall approach used here should be useful not just for future studies in this particular system, but also for molecular simulations of deposition in other materials.
- Authors:
-
- Univ. of Pennsylvania, Philadelphia, PA (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Univ. of New Mexico, Albuquerque, NM (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1342000
- Alternate Identifier(s):
- OSTI ID: 1244741
- Report Number(s):
- LLNL-JRNL-694161
Journal ID: ISSN 0039-6028
- Grant/Contract Number:
- AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Surface Science
- Additional Journal Information:
- Journal Volume: 641; Journal Issue: C; Journal ID: ISSN 0039-6028
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; molecular dynamics; atomic deposition; amorphous SiO2; germanium; silicon
Citation Formats
Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., and Sinno, Talid. Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions. United States: N. p., 2015.
Web. doi:10.1016/j.susc.2015.04.029.
Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., & Sinno, Talid. Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions. United States. https://doi.org/10.1016/j.susc.2015.04.029
Chuang, Claire Y., Zepeda-Ruiz, Luis A., Han, Sang M., and Sinno, Talid. Mon .
"Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions". United States. https://doi.org/10.1016/j.susc.2015.04.029. https://www.osti.gov/servlets/purl/1342000.
@article{osti_1342000,
title = {Direct molecular dynamics simulation of Ge deposition on amorphous SiO2 at experimentally relevant conditions},
author = {Chuang, Claire Y. and Zepeda-Ruiz, Luis A. and Han, Sang M. and Sinno, Talid},
abstractNote = {Molecular dynamics simulations were used to study Ge island nucleation and growth on amorphous SiO2 substrates. This process is relevant in selective epitaxial growth of Ge on Si, for which SiO2 is often used as a template mask. The islanding process was studied over a wide range of temperatures and fluxes, using a recently proposed empirical potential model for the Si–SiO2–Ge system. The simulations provide an excellent quantitative picture of the Ge islanding and compare well with detailed experimental measurements. These quantitative comparisons were enabled by an analytical rate model as a bridge between simulations and experiments despite the fact that deposition fluxes accessible in simulations and experiments are necessarily different by many orders of magnitude. In particular, the simulations led to accurate predictions of the critical island size and the scaling of island density as a function of temperature. Lastly, the overall approach used here should be useful not just for future studies in this particular system, but also for molecular simulations of deposition in other materials.},
doi = {10.1016/j.susc.2015.04.029},
journal = {Surface Science},
number = C,
volume = 641,
place = {United States},
year = {Mon Jun 01 00:00:00 EDT 2015},
month = {Mon Jun 01 00:00:00 EDT 2015}
}
Web of Science
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