New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle

Dodds, Nathaniel Anson; Dodd, Paul E.; Shaneyfelt, Marty R.; Sexton, Frederick W.; Martinez, Marino J.; Black, Jeffrey D.; Marshall, P. W.; Reed, R. A.; McCurdy, M. W.; Weller, R. A.; Pellish, J. A.; Rodbell, K. P.; Gordon, M. S.

doi:10.1109/TNS.2015.2488588

Title: New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle

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Abstract

In this study, we present low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed. Since the protons only had to penetrate a very thin buried oxide layer, these measurements were affected by far less energy loss, energy straggle, flux attrition, and angular scattering than previous datasets. The minimization of these common sources of experimental interference allows more direct interpretation of the data and deeper insight into SEU mechanisms. The results show a strong angular dependence, demonstrate that energy straggle, flux attrition, and angular scattering affect the measured SEU cross sections, and prove that proton direct ionization is the dominant mechanism for low-energy proton-induced SEUs in these circuits.

Authors:

Dodds, Nathaniel Anson ^[1]; Dodd, Paul E. ^[1]; Shaneyfelt, Marty R. ^[1]; Sexton, Frederick W. ^[1]; Martinez, Marino J. ^[1]; Black, Jeffrey D. ^[1]; Marshall, P. W. ^[2]; Reed, R. A. ^[3]; McCurdy, M. W. ^[3]; Weller, R. A. ^[3]; Pellish, J. A. ^[4]; Rodbell, K. P. ^[5]; Gordon, M. S. ^[5]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
NRL consultant, Brookneal, VA (United States)
Vanderbilt Univ., Nashville, TN (United States)
NASA Goddard Space Flight Center, Greenbelt, MD (United States)
IBM, T.J. Watson Research Center, Yorktown Heights, NY (United States)

Publication Date:: Tue Dec 01 00:00:00 EST 2015

Research Org.:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Org.:: USDOE National Nuclear Security Administration (NNSA)

OSTI Identifier:: 1238649

Report Number(s):: SAND-2015-8869J
Journal ID: ISSN 0018-9499; 614052; TRN: US1600397

Grant/Contract Number:: AC04-94AL85000

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 62; Journal Issue: 6; Journal ID: ISSN 0018-9499

Publisher:: Institute of Electrical and Electronics Engineers (IEEE)

Country of Publication:: United States

Language:: English

Subject:: 74 ATOMIC AND MOLECULAR PHYSICS; single-event effects; low-energy proton; proton direct ionization; soft error rate prediction

Citation Formats


                    Dodds, Nathaniel Anson, Dodd, Paul E., Shaneyfelt, Marty R., Sexton, Frederick W., Martinez, Marino J., Black, Jeffrey D., Marshall, P. W., Reed, R. A., McCurdy, M. W., Weller, R. A., Pellish, J. A., Rodbell, K. P., and Gordon, M. S. New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle.  United States: N. p., 2015. 
Web.  doi:10.1109/TNS.2015.2488588.

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                    Dodds, Nathaniel Anson, Dodd, Paul E., Shaneyfelt, Marty R., Sexton, Frederick W., Martinez, Marino J., Black, Jeffrey D., Marshall, P. W., Reed, R. A., McCurdy, M. W., Weller, R. A., Pellish, J. A., Rodbell, K. P., & Gordon, M. S. New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle.  United States.  https://doi.org/10.1109/TNS.2015.2488588

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                    Dodds, Nathaniel Anson, Dodd, Paul E., Shaneyfelt, Marty R., Sexton, Frederick W., Martinez, Marino J., Black, Jeffrey D., Marshall, P. W., Reed, R. A., McCurdy, M. W., Weller, R. A., Pellish, J. A., Rodbell, K. P., and Gordon, M. S. Tue .  
"New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle".  United States.  https://doi.org/10.1109/TNS.2015.2488588.  https://www.osti.gov/servlets/purl/1238649.

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@article{osti_1238649,

  title        = {New insights gained on mechanisms of low-energy proton-induced SEUs by minimizing energy straggle},

  author       = {Dodds, Nathaniel Anson and Dodd, Paul E. and Shaneyfelt, Marty R. and Sexton, Frederick W. and Martinez, Marino J. and Black, Jeffrey D. and Marshall, P. W. and Reed, R. A. and McCurdy, M. W. and Weller, R. A. and Pellish, J. A. and Rodbell, K. P. and Gordon, M. S.},

  abstractNote = {In this study, we present low-energy proton single-event upset (SEU) data on a 65 nm SOI SRAM whose substrate has been completely removed. Since the protons only had to penetrate a very thin buried oxide layer, these measurements were affected by far less energy loss, energy straggle, flux attrition, and angular scattering than previous datasets. The minimization of these common sources of experimental interference allows more direct interpretation of the data and deeper insight into SEU mechanisms. The results show a strong angular dependence, demonstrate that energy straggle, flux attrition, and angular scattering affect the measured SEU cross sections, and prove that proton direct ionization is the dominant mechanism for low-energy proton-induced SEUs in these circuits.},

  doi          = {10.1109/TNS.2015.2488588},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 6,

  volume       = 62,

  place        = {United States},

  year         = {Tue Dec 01 00:00:00 EST 2015},

  month        = {Tue Dec 01 00:00:00 EST 2015}

}

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