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Title: Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films

Abstract

For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB₂ films, including the thickness dependence of the lower critical field Hc₁. MgB₂ thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc₁ at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB₂/MgO multilayers to enhance the vortex penetration field.

Authors:
ORCiD logo; ; ; ; ; ; ; ; ORCiD logo;
Publication Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1179641
Alternate Identifier(s):
OSTI ID: 1200906; OSTI ID: 1421210
Grant/Contract Number:  
SC0011616
Resource Type:
Published Article
Journal Name:
APL Materials
Additional Journal Information:
Journal Name: APL Materials Journal Volume: 3 Journal Issue: 4; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, and Xi, X. X. Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films. United States: N. p., 2015. Web. doi:10.1063/1.4916696.
Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, & Xi, X. X. Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films. United States. https://doi.org/10.1063/1.4916696
Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, and Xi, X. X. Wed . "Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films". United States. https://doi.org/10.1063/1.4916696.
@article{osti_1179641,
title = {Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films},
author = {Tan, Teng and Wolak, M. A. and Acharya, Narendra and Krick, Alex and Lang, Andrew C. and Sloppy, Jennifer and Taheri, Mitra L. and Civale, L. and Chen, Ke and Xi, X. X.},
abstractNote = {For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB₂ films, including the thickness dependence of the lower critical field Hc₁. MgB₂ thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc₁ at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB₂/MgO multilayers to enhance the vortex penetration field.},
doi = {10.1063/1.4916696},
journal = {APL Materials},
number = 4,
volume = 3,
place = {United States},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4916696

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Cited by: 10 works
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