Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films
Abstract
For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB₂ films, including the thickness dependence of the lower critical field Hc₁. MgB₂ thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc₁ at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB₂/MgO multilayers to enhance the vortex penetration field.
- Authors:
- Publication Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1179641
- Alternate Identifier(s):
- OSTI ID: 1200906; OSTI ID: 1421210
- Grant/Contract Number:
- SC0011616
- Resource Type:
- Published Article
- Journal Name:
- APL Materials
- Additional Journal Information:
- Journal Name: APL Materials Journal Volume: 3 Journal Issue: 4; Journal ID: ISSN 2166-532X
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, and Xi, X. X. Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films. United States: N. p., 2015.
Web. doi:10.1063/1.4916696.
Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, & Xi, X. X. Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films. United States. https://doi.org/10.1063/1.4916696
Tan, Teng, Wolak, M. A., Acharya, Narendra, Krick, Alex, Lang, Andrew C., Sloppy, Jennifer, Taheri, Mitra L., Civale, L., Chen, Ke, and Xi, X. X. Wed .
"Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films". United States. https://doi.org/10.1063/1.4916696.
@article{osti_1179641,
title = {Enhancement of lower critical field by reducing the thickness of epitaxial and polycrystalline MgB 2 thin films},
author = {Tan, Teng and Wolak, M. A. and Acharya, Narendra and Krick, Alex and Lang, Andrew C. and Sloppy, Jennifer and Taheri, Mitra L. and Civale, L. and Chen, Ke and Xi, X. X.},
abstractNote = {For potential applications in superconducting RF cavities, we have investigated the properties of polycrystalline MgB₂ films, including the thickness dependence of the lower critical field Hc₁. MgB₂ thin films were fabricated by hybrid physical-chemical vapor deposition on (0001) SiC substrate either directly (for epitaxial films) or with a MgO buffer layer (for polycrystalline films). When the film thickness decreased from 300 nm to 100 nm, Hc₁ at 5 K increased from around 600 Oe to 1880 Oe in epitaxial films and to 1520 Oe in polycrystalline films. The result is promising for using MgB₂/MgO multilayers to enhance the vortex penetration field.},
doi = {10.1063/1.4916696},
journal = {APL Materials},
number = 4,
volume = 3,
place = {United States},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}
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https://doi.org/10.1063/1.4916696
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Cited by: 10 works
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