Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1103874
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Physical Review Letters
- Additional Journal Information:
- Journal Name: Physical Review Letters Journal Volume: 110 Journal Issue: 11; Journal ID: ISSN 0031-9007
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., and Wark, J. S. Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction. United States: N. p., 2013.
Web. doi:10.1103/PhysRevLett.110.115501.
Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., & Wark, J. S. Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction. United States. https://doi.org/10.1103/PhysRevLett.110.115501
Comley, A. J., Maddox, B. R., Rudd, R. E., Prisbrey, S. T., Hawreliak, J. A., Orlikowski, D. A., Peterson, S. C., Satcher, J. H., Elsholz, A. J., Park, H. -S., Remington, B. A., Bazin, N., Foster, J. M., Graham, P., Park, N., Rosen, P. A., Rothman, S. R., Higginbotham, A., Suggit, M., and Wark, J. S. Mon .
"Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction". United States. https://doi.org/10.1103/PhysRevLett.110.115501.
@article{osti_1103874,
title = {Strength of Shock-Loaded Single-Crystal Tantalum [100] Determined using In Situ Broadband X-Ray Laue Diffraction},
author = {Comley, A. J. and Maddox, B. R. and Rudd, R. E. and Prisbrey, S. T. and Hawreliak, J. A. and Orlikowski, D. A. and Peterson, S. C. and Satcher, J. H. and Elsholz, A. J. and Park, H. -S. and Remington, B. A. and Bazin, N. and Foster, J. M. and Graham, P. and Park, N. and Rosen, P. A. and Rothman, S. R. and Higginbotham, A. and Suggit, M. and Wark, J. S.},
abstractNote = {},
doi = {10.1103/PhysRevLett.110.115501},
journal = {Physical Review Letters},
number = 11,
volume = 110,
place = {United States},
year = {Mon Mar 11 00:00:00 EDT 2013},
month = {Mon Mar 11 00:00:00 EDT 2013}
}
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https://doi.org/10.1103/PhysRevLett.110.115501
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Cited by: 54 works
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