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A novel sputtering oxidation coupling (SOC) method to fabricate VO{sub 2} thin film

Abstract

VO{sub 2} thin film synthesized by a novel sputtering oxidation coupling (SOC) method has been successfully fabricated. The experimental results show that the optimum oxidation time is 285 s and the thin film exhibits a good metal-insulator transition (MIT) approximately at 340 K. The corresponding structures and surface compositions of the films have been characterized by X-ray diffractometer and X-ray photoelectron spectroscopy separately.
Authors:
Xu Xiaofeng, E-mail: xxf61@163.com; [1]  Anyuan, Yin; [2]  Xiliang, Du; [3]  Wang Jiqing, E-mail: jqwang@ee.ecnu.edu.cn; [4]  Jiading, Liu; Xinfeng, He; Xingxing, Liu; [1]  Yilong, Huan [5] 
  1. Department of Applied Physics, Donghua University, Shanghai 201620 (China)
  2. Department of Chemistry and Shanghai Key Laboratory of Molecular Catalysis and Innovative Materials, Fudan University, Shanghai 200433 (China)
  3. Electronic Engineering Institute, Hei Longjiang University, Harbin 150080 (China)
  4. Key Laboratory of Polarized Materials and Devices, East China Normal University, Shanghai 200062 (China)
  5. College of Textiles, Donghua University, Shanghai 201620 (China)
Publication Date:
Feb 15, 2010
Product Type:
Journal Article
Resource Relation:
Journal Name: Applied Surface Science; Journal Volume: 256; Journal Issue: 9; Other Information: Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COUPLING; METALS; OXIDATION; SURFACES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; VANADIUM OXIDES; X-RAY DIFFRACTOMETERS; X-RAY PHOTOELECTRON SPECTROSCOPY
OSTI ID:
22058049
Country of Origin:
Netherlands
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 0169-4332; CODEN: ASUSEE; Other: PII: S0169-4332(09)01611-0; TRN: NL10R0820018531
Availability:
Available from http://dx.doi.org/10.1016/j.apsusc.2009.11.022
Submitting Site:
NLN
Size:
page(s) 2750-2753
Announcement Date:
Feb 21, 2013

Citation Formats

Xu Xiaofeng, E-mail: xxf61@163.com, Anyuan, Yin, Xiliang, Du, Wang Jiqing, E-mail: jqwang@ee.ecnu.edu.cn, Jiading, Liu, Xinfeng, He, Xingxing, Liu, and Yilong, Huan. A novel sputtering oxidation coupling (SOC) method to fabricate VO{sub 2} thin film. Netherlands: N. p., 2010. Web. doi:10.1016/J.APSUSC.2009.11.022.
Xu Xiaofeng, E-mail: xxf61@163.com, Anyuan, Yin, Xiliang, Du, Wang Jiqing, E-mail: jqwang@ee.ecnu.edu.cn, Jiading, Liu, Xinfeng, He, Xingxing, Liu, & Yilong, Huan. A novel sputtering oxidation coupling (SOC) method to fabricate VO{sub 2} thin film. Netherlands. https://doi.org/10.1016/J.APSUSC.2009.11.022
Xu Xiaofeng, E-mail: xxf61@163.com, Anyuan, Yin, Xiliang, Du, Wang Jiqing, E-mail: jqwang@ee.ecnu.edu.cn, Jiading, Liu, Xinfeng, He, Xingxing, Liu, and Yilong, Huan. 2010. "A novel sputtering oxidation coupling (SOC) method to fabricate VO{sub 2} thin film." Netherlands. https://doi.org/10.1016/J.APSUSC.2009.11.022.
@misc{etde_22058049,
title = {A novel sputtering oxidation coupling (SOC) method to fabricate VO{sub 2} thin film}
author = {Xu Xiaofeng, E-mail: xxf61@163.com, Anyuan, Yin, Xiliang, Du, Wang Jiqing, E-mail: jqwang@ee.ecnu.edu.cn, Jiading, Liu, Xinfeng, He, Xingxing, Liu, and Yilong, Huan}
abstractNote = {VO{sub 2} thin film synthesized by a novel sputtering oxidation coupling (SOC) method has been successfully fabricated. The experimental results show that the optimum oxidation time is 285 s and the thin film exhibits a good metal-insulator transition (MIT) approximately at 340 K. The corresponding structures and surface compositions of the films have been characterized by X-ray diffractometer and X-ray photoelectron spectroscopy separately.}
doi = {10.1016/J.APSUSC.2009.11.022}
journal = []
issue = {9}
volume = {256}
journal type = {AC}
place = {Netherlands}
year = {2010}
month = {Feb}
}