Integrated Emissivity And Temperature Measurement
Abstract
A multi-channel spectrometer and a light source are used to measure both the emitted and the reflected light from a surface which is at an elevated temperature relative to its environment. In a first method, the temperature of the surface and emissivity in each wavelength is calculated from a knowledge of the spectrum and the measurement of the incident and reflected light. In the second method, the reflected light is measured from a reference surface having a known reflectivity and the same geometry as the surface of interest and the emitted and the reflected light are measured for the surface of interest. These measurements permit the computation of the emissivity in each channel of the spectrometer and the temperature of the surface of interest.
- Inventors:
-
- Livermore, CA
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 880167
- Patent Number(s):
- 6963816
- Application Number:
- 10/652336
- Assignee:
- The United States of America as represented by the United States Department of Energy (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Poulsen, Peter. Integrated Emissivity And Temperature Measurement. United States: N. p., 2005.
Web.
Poulsen, Peter. Integrated Emissivity And Temperature Measurement. United States.
Poulsen, Peter. Tue .
"Integrated Emissivity And Temperature Measurement". United States. https://www.osti.gov/servlets/purl/880167.
@article{osti_880167,
title = {Integrated Emissivity And Temperature Measurement},
author = {Poulsen, Peter},
abstractNote = {A multi-channel spectrometer and a light source are used to measure both the emitted and the reflected light from a surface which is at an elevated temperature relative to its environment. In a first method, the temperature of the surface and emissivity in each wavelength is calculated from a knowledge of the spectrum and the measurement of the incident and reflected light. In the second method, the reflected light is measured from a reference surface having a known reflectivity and the same geometry as the surface of interest and the emitted and the reflected light are measured for the surface of interest. These measurements permit the computation of the emissivity in each channel of the spectrometer and the temperature of the surface of interest.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 08 00:00:00 EST 2005},
month = {Tue Nov 08 00:00:00 EST 2005}
}