Propagation of misfit dislocations from buffer/Si interface into Si
Abstract
Misfit dislocations are redirected from the buffer/Si interface and propagated to the Si substrate due to the formation of bubbles in the substrate. The buffer layer growth process is generally a thermal process that also accomplishes annealing of the Si substrate so that bubbles of the implanted ion species are formed in the Si at an appropriate distance from the buffer/Si interface so that the bubbles will not migrate to the Si surface during annealing, but are close enough to the interface so that a strain field around the bubbles will be sensed by dislocations at the buffer/Si interface and dislocations are attracted by the strain field caused by the bubbles and move into the Si substrate instead of into the buffer epi-layer. Fabrication of improved integrated devices based on GaN and Si, such as continuous wave (CW) lasers and light emitting diodes, at reduced cost is thereby enabled.
- Inventors:
-
- El Sobrante, CA
- Porto Alegre, BR
- Richmond, VA
- Raleigh, VA
- Issue Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1023920
- Patent Number(s):
- 8008181
- Application Number:
- 12/540,274
- Assignee:
- The Regents of The University of California (Oakland, CA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01S - DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT
- DOE Contract Number:
- AC02-05CH11231
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Liliental-Weber, Zuzanna, Maltez, Rogerio Luis, Morkoc, Hadis, and Xie, Jinqiao. Propagation of misfit dislocations from buffer/Si interface into Si. United States: N. p., 2011.
Web.
Liliental-Weber, Zuzanna, Maltez, Rogerio Luis, Morkoc, Hadis, & Xie, Jinqiao. Propagation of misfit dislocations from buffer/Si interface into Si. United States.
Liliental-Weber, Zuzanna, Maltez, Rogerio Luis, Morkoc, Hadis, and Xie, Jinqiao. Tue .
"Propagation of misfit dislocations from buffer/Si interface into Si". United States. https://www.osti.gov/servlets/purl/1023920.
@article{osti_1023920,
title = {Propagation of misfit dislocations from buffer/Si interface into Si},
author = {Liliental-Weber, Zuzanna and Maltez, Rogerio Luis and Morkoc, Hadis and Xie, Jinqiao},
abstractNote = {Misfit dislocations are redirected from the buffer/Si interface and propagated to the Si substrate due to the formation of bubbles in the substrate. The buffer layer growth process is generally a thermal process that also accomplishes annealing of the Si substrate so that bubbles of the implanted ion species are formed in the Si at an appropriate distance from the buffer/Si interface so that the bubbles will not migrate to the Si surface during annealing, but are close enough to the interface so that a strain field around the bubbles will be sensed by dislocations at the buffer/Si interface and dislocations are attracted by the strain field caused by the bubbles and move into the Si substrate instead of into the buffer epi-layer. Fabrication of improved integrated devices based on GaN and Si, such as continuous wave (CW) lasers and light emitting diodes, at reduced cost is thereby enabled.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Aug 30 00:00:00 EDT 2011},
month = {Tue Aug 30 00:00:00 EDT 2011}
}
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