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Title: In-situ X-ray diffraction system using sources and detectors at fixed angular positions

Abstract

An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation--with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.

Inventors:
 [1];  [1];  [2]
  1. Voorheesville, NY
  2. Latham, NY
Issue Date:
Research Org.:
X-Ray Optical Systems, Inc
Sponsoring Org.:
USDOE
OSTI Identifier:
909719
Patent Number(s):
7236566
Application Number:
11/346,699
Assignee:
X-Ray Optical Systems, Inc
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
FG02-99ER82918
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Gibson, David M, Gibson, Walter M, and Huang, Huapeng. In-situ X-ray diffraction system using sources and detectors at fixed angular positions. United States: N. p., 2007. Web.
Gibson, David M, Gibson, Walter M, & Huang, Huapeng. In-situ X-ray diffraction system using sources and detectors at fixed angular positions. United States.
Gibson, David M, Gibson, Walter M, and Huang, Huapeng. Tue . "In-situ X-ray diffraction system using sources and detectors at fixed angular positions". United States. https://www.osti.gov/servlets/purl/909719.
@article{osti_909719,
title = {In-situ X-ray diffraction system using sources and detectors at fixed angular positions},
author = {Gibson, David M and Gibson, Walter M and Huang, Huapeng},
abstractNote = {An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation--with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2007},
month = {6}
}

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