In-situ X-ray diffraction system using sources and detectors at fixed angular positions
Abstract
An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation--with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.
- Inventors:
-
- Voorheesville, NY
- Latham, NY
- Issue Date:
- Research Org.:
- X-Ray Optical Systems, Inc
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 909719
- Patent Number(s):
- 7236566
- Application Number:
- 11/346,699
- Assignee:
- X-Ray Optical Systems, Inc
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- FG02-99ER82918
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Gibson, David M, Gibson, Walter M, and Huang, Huapeng. In-situ X-ray diffraction system using sources and detectors at fixed angular positions. United States: N. p., 2007.
Web.
Gibson, David M, Gibson, Walter M, & Huang, Huapeng. In-situ X-ray diffraction system using sources and detectors at fixed angular positions. United States.
Gibson, David M, Gibson, Walter M, and Huang, Huapeng. Tue .
"In-situ X-ray diffraction system using sources and detectors at fixed angular positions". United States. https://www.osti.gov/servlets/purl/909719.
@article{osti_909719,
title = {In-situ X-ray diffraction system using sources and detectors at fixed angular positions},
author = {Gibson, David M and Gibson, Walter M and Huang, Huapeng},
abstractNote = {An x-ray diffraction technique for measuring a known characteristic of a sample of a material in an in-situ state. The technique includes using an x-ray source for emitting substantially divergent x-ray radiation--with a collimating optic disposed with respect to the fixed source for producing a substantially parallel beam of x-ray radiation by receiving and redirecting the divergent paths of the divergent x-ray radiation. A first x-ray detector collects radiation diffracted from the sample; wherein the source and detector are fixed, during operation thereof, in position relative to each other and in at least one dimension relative to the sample according to a-priori knowledge about the known characteristic of the sample. A second x-ray detector may be fixed relative to the first x-ray detector according to the a-priori knowledge about the known characteristic of the sample, especially in a phase monitoring embodiment of the present invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 26 00:00:00 EDT 2007},
month = {Tue Jun 26 00:00:00 EDT 2007}
}