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Title: High reflectance-low stress Mo-Si multilayer reflective coatings

Abstract

A high reflectance-low stress Mo-Si multilayer reflective coating particularly useful for the extreme ultraviolet (EUV) wavelength region. While the multilayer reflective coating has particular application for EUV lithography, it has numerous other applications where high reflectance and low stress multilayer coatings are utilized. Multilayer coatings having high near-normal incidence reflectance (R.gtoreq.65%) and low residual stress (.ltoreq.100 MPa) have been produced using thermal and non-thermal approaches. The thermal approach involves heating the multilayer coating to a given temperature for a given time after deposition in order to induce structural changes in the multilayer coating that will have an overall "relaxation" effect without reducing the reflectance significantly.

Inventors:
 [1];  [2]
  1. Livermore, CA
  2. Sunol, CA
Issue Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
OSTI Identifier:
873195
Patent Number(s):
6110607
Assignee:
Regents of University of California (Oakland, CA)
Patent Classifications (CPCs):
C - CHEMISTRY C03 - GLASS C03C - CHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS
G - PHYSICS G02 - OPTICS G02B - OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
reflectance-low; stress; mo-si; multilayer; reflective; coatings; coating; particularly; useful; extreme; ultraviolet; euv; wavelength; region; particular; application; lithography; numerous; applications; reflectance; utilized; near-normal; incidence; gtoreq; 65; residual; ltoreq; 100; mpa; produced; thermal; non-thermal; approaches; approach; involves; heating; temperature; time; deposition; induce; structural; changes; overall; relaxation; effect; reducing; significantly; multilayer reflective; multilayer coatings; normal incidence; reflective coating; wavelength region; multilayer coating; reflective coatings; particular application; particularly useful; extreme ultraviolet; residual stress; approach involves; stress multilayer; stress mo-si; reflectance-low stress; mo-si multilayer; involves heating; structural changes; /428/359/427/

Citation Formats

Montcalm, Claude, and Mirkarimi, Paul B. High reflectance-low stress Mo-Si multilayer reflective coatings. United States: N. p., 2000. Web.
Montcalm, Claude, & Mirkarimi, Paul B. High reflectance-low stress Mo-Si multilayer reflective coatings. United States.
Montcalm, Claude, and Mirkarimi, Paul B. Sat . "High reflectance-low stress Mo-Si multilayer reflective coatings". United States. https://www.osti.gov/servlets/purl/873195.
@article{osti_873195,
title = {High reflectance-low stress Mo-Si multilayer reflective coatings},
author = {Montcalm, Claude and Mirkarimi, Paul B},
abstractNote = {A high reflectance-low stress Mo-Si multilayer reflective coating particularly useful for the extreme ultraviolet (EUV) wavelength region. While the multilayer reflective coating has particular application for EUV lithography, it has numerous other applications where high reflectance and low stress multilayer coatings are utilized. Multilayer coatings having high near-normal incidence reflectance (R.gtoreq.65%) and low residual stress (.ltoreq.100 MPa) have been produced using thermal and non-thermal approaches. The thermal approach involves heating the multilayer coating to a given temperature for a given time after deposition in order to induce structural changes in the multilayer coating that will have an overall "relaxation" effect without reducing the reflectance significantly.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 2000},
month = {Sat Jan 01 00:00:00 EST 2000}
}

Works referenced in this record:

Stress relaxation in Mo/Si multilayer structures
journal, June 1992


Variation in stress with background pressure in sputtered Mo/Si multilayer films
journal, August 1995


Multilayer sputter deposition stress control
journal, May 1996


Structural and residual stress changes in Mo/a-Si multilayer thin films with annealing
journal, January 1996