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Title: Method and apparatus for measuring film spectral properties

Abstract

Film spectral properties are measured by projecting chopped monochromatic light onto a luminescent film sample deposited on a substrate, and coupling through use of immersion oil the reflection of light therefrom to a light detector.

Inventors:
 [1];  [1];  [1];  [2]
  1. Princeton, NJ
  2. Metuchen, NJ
Issue Date:
Research Org.:
National Renewable Energy Laboratory (NREL), Golden, CO (United States)
OSTI Identifier:
872777
Patent Number(s):
6005252
Application Number:
08/936,922
Assignee:
Trustees of Princeton University (Princeton, NJ)
Patent Classifications (CPCs):
C - CHEMISTRY C09 - DYES C09K - MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
DOE Contract Number:  
XAI-3-11167-03
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; measuring; film; spectral; properties; measured; projecting; chopped; monochromatic; light; luminescent; sample; deposited; substrate; coupling; immersion; oil; reflection; therefrom; detector; light detector; monochromatic light; spectral properties; film sample; sample deposited; measuring film; film spectral; chromatic light; /250/

Citation Formats

Forrest, Stephen R, Burrows, Paul E, Garbuzov, Dmitri Z, and Bulovic, Vladimir. Method and apparatus for measuring film spectral properties. United States: N. p., 1999. Web.
Forrest, Stephen R, Burrows, Paul E, Garbuzov, Dmitri Z, & Bulovic, Vladimir. Method and apparatus for measuring film spectral properties. United States.
Forrest, Stephen R, Burrows, Paul E, Garbuzov, Dmitri Z, and Bulovic, Vladimir. Fri . "Method and apparatus for measuring film spectral properties". United States. https://www.osti.gov/servlets/purl/872777.
@article{osti_872777,
title = {Method and apparatus for measuring film spectral properties},
author = {Forrest, Stephen R and Burrows, Paul E and Garbuzov, Dmitri Z and Bulovic, Vladimir},
abstractNote = {Film spectral properties are measured by projecting chopped monochromatic light onto a luminescent film sample deposited on a substrate, and coupling through use of immersion oil the reflection of light therefrom to a light detector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 1999},
month = {Fri Jan 01 00:00:00 EST 1999}
}

Works referenced in this record:

Electroluminescence of doped organic thin films
journal, May 1989


Improvements In CCD Quantum Efficiency In The UV And Near-IR
conference, May 1989


Organic photovoltaic solar cells based on some pure and sensitized dyes
journal, December 1991


Photoluminescence efficiency and absorption of aluminum-tris-quinolate (Alq3) thin films
journal, February 1996


Optimizing Charge-Coupled Devices For Red And Near-Infrared Observations
conference, May 1989


Electroluminescence from trap‐limited current transport in vacuum deposited organic light emitting devices
journal, April 1994


Reflected-light, photoluminescence and OBIC imaging of solar cells using a confocal scanning laser MACROscope/microscope
journal, December 1996


Sol-gel glasses: a new material for solar fluorescent planar concentrators?
journal, December 1990


Detector for the VUV to the IR using sodium salicylate as a combined fluorescent and reflective coating
journal, January 1985


Ultraviolet downconverting phosphor for use with silicon CCD imagers
journal, January 1980