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Title: Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials

The intensity and phase of one or more ultrashort light pulses are obtained using a non-linear optical medium. Information derived from the light pulses is also used to measure optical properties of materials. Various retrieval techniques are employed. Both "instantaneously" and "non-instantaneously" responding optical mediums may be used.
Inventors:
 [1];  [1]
  1. (Livermore, CA)
Issue Date:
OSTI Identifier:
870489
Assignee:
Sandia Corporation (Albuquerque, NM) LANL
Patent Number(s):
US 5530544
Contract Number:
W-7405-ENG-36
Research Org:
Los Alamos National Laboratory (LANL), Los Alamos, NM
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; measuring; intensity; phase; ultrashort; light; pulses; optical; properties; materials; obtained; non-linear; medium; information; derived; measure; various; retrieval; techniques; employed; instantaneously; non-instantaneously; responding; mediums; non-linear optical; measuring optical; light pulses; optical properties; light pulse; optical medium; ultrashort light; responding optical; information derived; /356/