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Title: Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings

Abstract

A technique for determining properties such as Young's modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined.

Inventors:
 [1];  [2];  [3]
  1. Somerville, MA
  2. Cambridge, MA
  3. Wellesley, MA
Issue Date:
Research Org.:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
OSTI Identifier:
872029
Patent Number(s):
5847283
Assignee:
Massachusetts Institute of Technology (Cambridge, MA)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B33 - ADDITIVE MANUFACTURING TECHNOLOGY B33Y - ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC07-94ID13223
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; evaluation; depth; profile; thermo-mechanical; properties; layered; graded; materials; coatings; technique; determining; modulus; coefficient; thermal; expansion; residual; stress; individual; layers; multi-layered; sample; involves; preparation; series; samples; including; additional; layer; relative; preceding; comparison; topmost; determined; resulting; deposition; top; individual layers; dual layer; top layer; thermal expansion; mechanical properties; residual stress; technique involves; graded materials; additional layer; determining properties; /73/

Citation Formats

Finot, Marc, Kesler, Olivera, and Suresh, Subra. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings. United States: N. p., 1998. Web.
Finot, Marc, Kesler, Olivera, & Suresh, Subra. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings. United States.
Finot, Marc, Kesler, Olivera, and Suresh, Subra. Thu . "Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings". United States. https://www.osti.gov/servlets/purl/872029.
@article{osti_872029,
title = {Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings},
author = {Finot, Marc and Kesler, Olivera and Suresh, Subra},
abstractNote = {A technique for determining properties such as Young's modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1998},
month = {1}
}

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Works referenced in this record:

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