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Title: Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings

Abstract

A technique for determining properties such as Young`s modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined. 11 figs.

Inventors:
; ;
Issue Date:
Research Org.:
Idaho National Laboratory (INL), Idaho Falls, ID (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States); Department of the Navy, Washington, DC (United States)
OSTI Identifier:
321216
Patent Number(s):
5847283
Application Number:
PAN: 8-675,121; CNN: Grant N00014-94-1-0139
Assignee:
Massachusetts Inst. of Tech., Cambridge, MA (United States)
DOE Contract Number:  
AC07-94ID13223
Resource Type:
Patent
Resource Relation:
Other Information: PBD: 8 Dec 1998
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES; COMPOSITE MATERIALS; LAYERS; YOUNG MODULUS; THERMAL EXPANSION; RESIDUAL STRESSES; SAMPLE PREPARATION; MEASURING METHODS; MATERIALS TESTING

Citation Formats

Finot, M, Kesler, O, and Suresh, S. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings. United States: N. p., 1998. Web.
Finot, M, Kesler, O, & Suresh, S. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings. United States.
Finot, M, Kesler, O, and Suresh, S. Tue . "Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings". United States.
@article{osti_321216,
title = {Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings},
author = {Finot, M and Kesler, O and Suresh, S},
abstractNote = {A technique for determining properties such as Young`s modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined. 11 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 08 00:00:00 EST 1998},
month = {Tue Dec 08 00:00:00 EST 1998}
}

Patent:
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