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Title: Optical wet steam monitor

Abstract

A wet steam monitor determines steam particle size by using laser doppler velocimeter (LDV) device to produce backscatter light. The backscatter light signal is processed with a spectrum analyzer to produce a visibility waveform in the frequency domain. The visibility waveform includes a primary peak and a plurality of sidebands. The bandwidth of at least the primary frequency peak is correlated to particle size by either visually comparing the bandwidth to those of known particle sizes, or by digitizing the waveform and comparing the waveforms electronically.

Inventors:
 [1];  [2]
  1. Powell, TN
  2. Knoxville, TN
Issue Date:
Research Org.:
LOCKHEED MARTIN ENRGY SYST INC
OSTI Identifier:
869714
Patent Number(s):
5383024
Assignee:
Martin Marietta Energy Systems, Inc. (Oak Ridge, TN)
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
optical; wet; steam; monitor; determines; particle; size; laser; doppler; velocimeter; device; produce; backscatter; light; signal; processed; spectrum; analyzer; visibility; waveform; frequency; domain; primary; peak; plurality; sidebands; bandwidth; correlated; visually; comparing; sizes; digitizing; waveforms; electronically; spectrum analyzer; frequency domain; particle size; light signal; particle sizes; backscatter light; laser doppler; steam monitor; wet steam; frequency peak; /356/

Citation Formats

Maxey, Lonnie C, and Simpson, Marc L. Optical wet steam monitor. United States: N. p., 1995. Web.
Maxey, Lonnie C, & Simpson, Marc L. Optical wet steam monitor. United States.
Maxey, Lonnie C, and Simpson, Marc L. Sun . "Optical wet steam monitor". United States. https://www.osti.gov/servlets/purl/869714.
@article{osti_869714,
title = {Optical wet steam monitor},
author = {Maxey, Lonnie C and Simpson, Marc L},
abstractNote = {A wet steam monitor determines steam particle size by using laser doppler velocimeter (LDV) device to produce backscatter light. The backscatter light signal is processed with a spectrum analyzer to produce a visibility waveform in the frequency domain. The visibility waveform includes a primary peak and a plurality of sidebands. The bandwidth of at least the primary frequency peak is correlated to particle size by either visually comparing the bandwidth to those of known particle sizes, or by digitizing the waveform and comparing the waveforms electronically.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

Patent:

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