Test probe for surface mounted leadless chip carrier
Abstract
A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe.
- Inventors:
-
- Raytown, MO
- Lenexa, KS
- Issue Date:
- Research Org.:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- OSTI Identifier:
- 866978
- Patent Number(s):
- 4833404
- Application Number:
- 07/103,865
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- AC04-76DP00613
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- probe; surface; mounted; leadless; chip; carrier; disclosed; probed; specially; designed; connector; pins; allow; size; reductions; thermoplastic; housing; provides; spring; action; ensure; mechanical; electrical; contact; strips; features; flexible; wires; molded; types; alternately; placed; fabrication; simpler; surface mounted; specially designed; electrical contact; chip carrier; leadless chip; housing provides; mounted leadless; surface mount; plastic housing; /324/439/
Citation Formats
Meyer, Kerry L, and Topolewski, John. Test probe for surface mounted leadless chip carrier. United States: N. p., 1989.
Web.
Meyer, Kerry L, & Topolewski, John. Test probe for surface mounted leadless chip carrier. United States.
Meyer, Kerry L, and Topolewski, John. Tue .
"Test probe for surface mounted leadless chip carrier". United States. https://www.osti.gov/servlets/purl/866978.
@article{osti_866978,
title = {Test probe for surface mounted leadless chip carrier},
author = {Meyer, Kerry L and Topolewski, John},
abstractNote = {A test probe for a surface mounted leadless chip carrier is disclosed. The probed includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue May 23 00:00:00 EDT 1989},
month = {Tue May 23 00:00:00 EDT 1989}
}
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