Test probe for surface mounted leadless chip carrier
Abstract
A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.
- Inventors:
- Issue Date:
- Research Org.:
- Allied Corp., Kansas City, MO (USA). Bendix Kansas City Div.
- OSTI Identifier:
- 6867816
- Patent Number(s):
- 6103865
- Assignee:
- TIC; EDB-88-179049
- Patent Classifications (CPCs):
-
C - CHEMISTRY C08 - ORGANIC MACROMOLECULAR COMPOUNDS C08G - MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
C - CHEMISTRY C08 - ORGANIC MACROMOLECULAR COMPOUNDS C08F - MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- DOE Contract Number:
- AC04-76DP00613
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; ELECTRIC PROBES; DESIGN; CONNECTORS; ELECTRICAL TESTING; ELECTRONIC CIRCUITS; INVENTIONS; PRINTED CIRCUITS; CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROBES; TESTING; 420800* - Engineering- Electronic Circuits & Devices- (-1989)
Citation Formats
Meyer, K L, and Topolewski, J. Test probe for surface mounted leadless chip carrier. United States: N. p., 1987.
Web.
Meyer, K L, & Topolewski, J. Test probe for surface mounted leadless chip carrier. United States.
Meyer, K L, and Topolewski, J. Fri .
"Test probe for surface mounted leadless chip carrier". United States.
@article{osti_6867816,
title = {Test probe for surface mounted leadless chip carrier},
author = {Meyer, K L and Topolewski, J},
abstractNote = {A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {10}
}
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