Test probe for surface mounted leadless chip carrier
Abstract
A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.
- Inventors:
- Issue Date:
- Research Org.:
- Allied Corp., Kansas City, MO (USA). Bendix Kansas City Div.
- OSTI Identifier:
- 6867816
- Patent Number(s):
- -US-A6103865
- Assignee:
- TIC; EDB-88-179049
- DOE Contract Number:
- AC04-76DP00613
- Resource Type:
- Patent
- Resource Relation:
- Other Information: Portions of this document are illegible in microfiche products
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING; ELECTRIC PROBES; DESIGN; CONNECTORS; ELECTRICAL TESTING; ELECTRONIC CIRCUITS; INVENTIONS; PRINTED CIRCUITS; CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS TESTING; NONDESTRUCTIVE TESTING; PROBES; TESTING 420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
Citation Formats
Meyer, K.L., and Topolewski, J. Test probe for surface mounted leadless chip carrier. United States: N. p., 1987.
Web.
Meyer, K.L., & Topolewski, J. Test probe for surface mounted leadless chip carrier. United States.
Meyer, K.L., and Topolewski, J. Fri .
"Test probe for surface mounted leadless chip carrier". United States.
@article{osti_6867816,
title = {Test probe for surface mounted leadless chip carrier},
author = {Meyer, K.L. and Topolewski, J.},
abstractNote = {A test probe for a surface mounted leadless chip carrier is disclosed. The probe includes specially designed connector pins which allow size reductions in the probe. A thermoplastic housing provides spring action to ensure good mechanical and electrical contact between the pins and the contact strips of a leadless chip carrier. Other features include flexible wires molded into the housing and two different types of pins alternately placed in the housing. These features allow fabrication of a smaller and simpler test probe. 1 fig.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {10}
}
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.