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Title: Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Abstract

Disclosed is a method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system. 16 figs.

Inventors:
Issue Date:
OSTI Identifier:
7232736
Patent Number(s):
5165794 A
Application Number:
PPN: US 7-739376
Assignee:
Dept. of Energy, Washington, DC (United States) PTO; EDB-94-090179
DOE Contract Number:  
AC07-76ID01570
Resource Type:
Patent
Resource Relation:
Patent File Date: 2 Aug 1991
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; ELECTRIC CONDUCTORS; NONDESTRUCTIVE TESTING; PHYSICAL PROPERTIES; DATA ANALYSIS; ELECTRIC CONDUCTIVITY; MEASURING METHODS; ELECTRICAL PROPERTIES; MATERIALS TESTING; TESTING; 420500* - Engineering- Materials Testing

Citation Formats

Ortiz, M.G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States: N. p., 1992. Web.
Ortiz, M.G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States.
Ortiz, M.G. Tue . "Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures". United States.
@article{osti_7232736,
title = {Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures},
author = {Ortiz, M.G.},
abstractNote = {Disclosed is a method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system. 16 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {11}
}