Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Title: Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Full Record
Other Related Research

Abstract

A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.

Inventors:

Ortiz, Marcos G ^[1]

Idaho Falls, ID

Issue Date:: 1992-01-01

Research Org.:: EG & G IDAHO INC

OSTI Identifier:: 868551

Patent Number(s):: 5165794

Assignee:: United States of America as represented by United States (Washington, DC)

DOE Contract Number:: AC07-76ID01570

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: method; thermal; characterization; visualization; integrity; evaluation; conducting; material; samples; complex; structures; modeling; sample; structure; called; regions; comprise; electrical; network; resistances; measuring; electric; resistance; selected; pairs; external; leads; attached; surface; lead; basic; circuit; theory; translating; measured; temperatures; thermophysical; properties; corresponding; conducting material; physical properties; material sample; electric resistance; material samples; complex structures; electrical network; integrity evaluation; /374/

Citation Formats


                    Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures.  United States: N. p., 1992. 
        Web.

Copy to clipboard


                    Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures.  United States.

Copy to clipboard


                    Ortiz, Marcos G. Wed .  
        "Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures".  United States.  https://www.osti.gov/servlets/purl/868551.

Copy to clipboard


                    
@article{osti_868551,

  title        = {Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures},

  author       = {Ortiz, Marcos G},

  abstractNote = {A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1992},

  month        = {1}

}

Copy to clipboard

Patent:

View Patent

Save / Share:

Export Metadata

Save to My Library

Similar records in DOE Patents and OSTI.GOV collections:

Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Patent Ortiz, M G

Disclosed is a method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system. 16 figs.
A method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Patent Application Ortiz, M G

This invention is useful in thermal imaging of conducting materials, and is particularly useful in measuring thermal conductivity and thermal boundary conditions in composite anisotropic materials, in materials of irregular shape, and in materials for high-temperature applications. It also has utility in visualizing the integrity of complex structures such as a machine, power plant, or chemical plant. The method is for modeling a conducting material sample or structure (system) as an electrical network of resistances, for measuring electric resistance between selected leads attached to the surface of the system, and, using basic circuit theory, for translating measured resistances into temperaturesmore »« less
Full Text Available
Electrical network method for the thermal or structural characterization of a conducting material sample or structure

Patent Ortiz, Marco G [Idaho Falls, ID]

A method for modeling a conducting material sample or structure system, as an electrical network of resistances in which each resistance of the network is representative of a specific physical region of the system. The method encompasses measuring a resistance between two external leads and using this measurement in a series of equations describing the network to solve for the network resistances for a specified region and temperature. A calibration system is then developed using the calculated resistances at specified temperatures. This allows for the translation of the calculated resistances to a region temperature. The method can also be usedmore »« less
Full Text Available
Method and apparatus for determining material structural integrity

Patent Pechersky, Martin [Aiken, SC]

A non-destructive method and apparatus for determining the structural integrity of materials by combining laser vibrometry with damping analysis techniques to determine the damping loss factor of a material. The method comprises the steps of vibrating the area being tested over a known frequency range and measuring vibrational force and velocity as a function of time over the known frequency range. Vibrational velocity is preferably measured by a laser vibrometer. Measurement of the vibrational force depends on the vibration method. If an electromagnetic coil is used to vibrate a magnet secured to the area being tested, then the vibrational forcemore »« less
Full Text Available
Electrofracturing test system and method of determining material characteristics of electrofractured material samples

Patent Bauer, Stephen J.; Glover, Steven F.; Pfeifle, Tom; ...

A device for electrofracturing a material sample and analyzing the material sample is disclosed. The device simulates an in situ electrofracturing environment so as to obtain electrofractured material characteristics representative of field applications while allowing permeability testing of the fractured sample under in situ conditions.
Full Text Available

Similar Records