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Title: Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Abstract

A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.

Inventors:
 [1]
  1. Idaho Falls, ID
Issue Date:
Research Org.:
EG & G IDAHO INC
OSTI Identifier:
868551
Patent Number(s):
5165794
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
AC07-76ID01570
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; thermal; characterization; visualization; integrity; evaluation; conducting; material; samples; complex; structures; modeling; sample; structure; called; regions; comprise; electrical; network; resistances; measuring; electric; resistance; selected; pairs; external; leads; attached; surface; lead; basic; circuit; theory; translating; measured; temperatures; thermophysical; properties; corresponding; conducting material; physical properties; material sample; electric resistance; material samples; complex structures; electrical network; integrity evaluation; /374/

Citation Formats

Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States: N. p., 1992. Web.
Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures. United States.
Ortiz, Marcos G. Wed . "Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures". United States. https://www.osti.gov/servlets/purl/868551.
@article{osti_868551,
title = {Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures},
author = {Ortiz, Marcos G},
abstractNote = {A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1992},
month = {1}
}

Patent:

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