Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

Title: Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures

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Abstract

A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.

Inventors:

Ortiz, Marcos G ^[1]

Idaho Falls, ID

Issue Date:: 1992-01-01

Research Org.:: EG & G IDAHO INC

OSTI Identifier:: 868551

Patent Number(s):: 5165794

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
G01K1/026 - {arrangements for monitoring a plurality of temperatures, e.g. by multiplexing}

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N27/041 - {of a solid body}

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DOE Contract Number:: AC07-76ID01570

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: method; thermal; characterization; visualization; integrity; evaluation; conducting; material; samples; complex; structures; modeling; sample; structure; called; regions; comprise; electrical; network; resistances; measuring; electric; resistance; selected; pairs; external; leads; attached; surface; lead; basic; circuit; theory; translating; measured; temperatures; thermophysical; properties; corresponding; conducting material; physical properties; material sample; electric resistance; material samples; complex structures; electrical network; integrity evaluation; /374/

Citation Formats


                    Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures.  United States: N. p., 1992. 
        Web.

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                    Ortiz, Marcos G. Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures.  United States.

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                    Ortiz, Marcos G. Wed .  
        "Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures".  United States.  https://www.osti.gov/servlets/purl/868551.

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@article{osti_868551,

  title        = {Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures},

  author       = {Ortiz, Marcos G},

  abstractNote = {A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1992},

  month        = {1}

}

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