Arbitrary electron dose waveforms for electron microscopy

Bloom, Ruth Shewmon; Reed, Bryan Walter; Masiel, Daniel Joseph; Park, Sang Tae

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Title: Arbitrary electron dose waveforms for electron microscopy

Abstract

A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.

Inventors:: Bloom, Ruth Shewmon; Reed, Bryan Walter; Masiel, Daniel Joseph; Park, Sang Tae

Issue Date:: Tue Oct 18 00:00:00 EDT 2022

Research Org.:: Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1986717

Patent Number(s):: 11476082

Application Number:: 17/688,339

Assignee:: Integrated Dynamic Electron Solutions, Inc. (Pleasanton, CA)

DOE Contract Number:: SC0013104

Resource Type:: Patent

Resource Relation:: Patent File Date: 03/07/2022

Country of Publication:: United States

Language:: English

Citation Formats


                    Bloom, Ruth Shewmon, Reed, Bryan Walter, Masiel, Daniel Joseph, and Park, Sang Tae. Arbitrary electron dose waveforms for electron microscopy.  United States: N. p., 2022. 
        Web.

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                    Bloom, Ruth Shewmon, Reed, Bryan Walter, Masiel, Daniel Joseph, & Park, Sang Tae. Arbitrary electron dose waveforms for electron microscopy.  United States.

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                    Bloom, Ruth Shewmon, Reed, Bryan Walter, Masiel, Daniel Joseph, and Park, Sang Tae. Tue .  
        "Arbitrary electron dose waveforms for electron microscopy".  United States.  https://www.osti.gov/servlets/purl/1986717.

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@article{osti_1986717,

  title        = {Arbitrary electron dose waveforms for electron microscopy},

  author       = {Bloom, Ruth Shewmon and Reed, Bryan Walter and Masiel, Daniel Joseph and Park, Sang Tae},

  abstractNote = {A device may include an electron source, a detector, and a deflector. The electron source may be directed toward a sample area. The detector may receive an electron signal or an electron-induced signal. A deflector may be positioned between the electron source and the sample. The deflector may modulate an intensity of the electron source directed to the sample area according to an electron dose waveform having a continuously variable temporal profile.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Oct 18 00:00:00 EDT 2022},

  month        = {Tue Oct 18 00:00:00 EDT 2022}

}

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Similar Records

Title: Arbitrary electron dose waveforms for electron microscopy

Abstract

Citation Formats

Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy journal, February 2016

Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology journal, September 2013

Multiscale Random Projections for Compressive Classification conference, January 2007

Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen patent, December 1983

Electron Beam System and Method of Manufacturing Devices Using the System patent-application, June 2005

Movie-mode dynamic electron microscopy journal, January 2015

An Introduction To Compressive Sampling journal, March 2008

Single-pixel imaging via compressive sampling journal, March 2008

Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information journal, February 2006

System and method for compressive scanning electron microscopy patent, January 2015

Temporal compressive sensing systems patent, December 2017

High-Speed Multi-Frame Dynamic Transmission Electron Microscope Image Acquisition System with Arbitrary Timing patent-application, November 2015

High Framerate and High Dynamic Range Electron Microscopy patent-application, March 2021

Background Removal and Data Analysis for Low-Loss Transmission Electron Energy-Loss Spectroscopy journal, August 2002

Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states journal, January 2016

TEM Phase Contrast Imaging With Image Plane Phase Grating patent-application, January 2017

Implementing Sub-sampling Methods for Low-Dose (Scanning) Transmission Electron Microscopy (S/TEM) journal, July 2017

Electron Microscope patent-application, February 2006

This is SPIRAL-TAP: Sparse Poisson Intensity Reconstruction ALgorithms—Theory and Practice journal, March 2012

Mitigating Damage to Hybrid Perovskites Using Pulsed-Beam TEM journal, December 2020

Sparsity, Parsimony and Data Reduction - Applications across Multi-Dimensional Electron Microscopy journal, July 2017

Influence of cathode geometry on electron dynamics in an ultrafast electron microscope journal, September 2017

Compressively Sensed Video Acquisition in Transmission Electron Microscopy journal, July 2017

Scanning electron microscope patent, February 1999

Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode journal, December 2016

Atomic-Resolution Imaging of Fast Nanoscale Dynamics with Bright Microsecond Electron Pulses journal, December 2020

Systems and Methods for Charged Particle Beam Modulation patent-application, June 2020

Applying compressive sensing to TEM video: a substantial frame rate increase on any camera journal, August 2015

GHz laser-free time-resolved transmission electron microscopy: A stroboscopic high-duty-cycle method journal, February 2016

Fast Gradient-Based Algorithms for Constrained Total Variation Image Denoising and Deblurring Problems journal, November 2009

Simultaneous observation of the quantization and the interference pattern of a plasmonic near-field journal, March 2015

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations journal, July 2017

Grey scale structures formation in SU-8 with e-beam and UV journal, June 2003

Electron Beam Exposure System patent-application, September 2005

Development of a fast electromagnetic beam blanker for compressed sensing in scanning transmission electron microscopy
journal, February 2016

Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology
journal, September 2013

Multiscale Random Projections for Compressive Classification
conference, January 2007

Scanning electron microscope or similar equipment capable of displaying simultaneously a plurality of images of specimen
patent, December 1983

Electron Beam System and Method of Manufacturing Devices Using the System
patent-application, June 2005

Movie-mode dynamic electron microscopy
journal, January 2015

An Introduction To Compressive Sampling
journal, March 2008

Single-pixel imaging via compressive sampling
journal, March 2008

Robust uncertainty principles: exact signal reconstruction from highly incomplete frequency information
journal, February 2006

System and method for compressive scanning electron microscopy
patent, January 2015

Temporal compressive sensing systems
patent, December 2017

High-Speed Multi-Frame Dynamic Transmission Electron Microscope Image Acquisition System with Arbitrary Timing
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High Framerate and High Dynamic Range Electron Microscopy
patent-application, March 2021

Background Removal and Data Analysis for Low-Loss Transmission Electron Energy-Loss Spectroscopy
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Time-resolved cathodoluminescence microscopy with sub-nanosecond beam blanking for direct evaluation of the local density of states
journal, January 2016

TEM Phase Contrast Imaging With Image Plane Phase Grating
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Implementing Sub-sampling Methods for Low-Dose (Scanning) Transmission Electron Microscopy (S/TEM)
journal, July 2017

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This is SPIRAL-TAP: Sparse Poisson Intensity Reconstruction ALgorithms—Theory and Practice
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Mitigating Damage to Hybrid Perovskites Using Pulsed-Beam TEM
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