Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Sun, Ding; Shemyakin, Alexander

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Title: Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Abstract

A Fast Faraday cup includes a group of electrodes including a ground electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the ground electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.

Inventors:: Sun, Ding; Shemyakin, Alexander

Issue Date:: Tue Feb 09 00:00:00 EST 2021

Research Org.:: Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1805497

Patent Number(s):: 10914766

Application Number:: 16/101,982

Assignee:: Fermi Research Alliance, LLC (Batavia, IL)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

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G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R19/0061 - {Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/2914 - {Measurement of spatial distribution of radiation}

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/24405 - Faraday cages
H01J2237/24507 - Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Show less

DOE Contract Number:: AC02-07CH11359

Resource Type:: Patent

Resource Relation:: Patent File Date: 08/13/2018

Country of Publication:: United States

Language:: English

Citation Formats


                    Sun, Ding, and Shemyakin, Alexander. Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams.  United States: N. p., 2021. 
        Web.

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                    Sun, Ding, & Shemyakin, Alexander. Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams.  United States.

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                    Sun, Ding, and Shemyakin, Alexander. Tue .  
        "Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams".  United States.  https://www.osti.gov/servlets/purl/1805497.

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@article{osti_1805497,

  title        = {Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams},

  author       = {Sun, Ding and Shemyakin, Alexander},

  abstractNote = {A Fast Faraday cup includes a group of electrodes including a ground electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the ground electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Feb 09 00:00:00 EST 2021},

  month        = {Tue Feb 09 00:00:00 EST 2021}

}

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Works referenced in this record:

Use of ion induced luminescence (IIL) as feedback control for ion implantation
patent-application, June 2008

Berry, Ivan L.
US Patent Application 11/633694; 20080128621
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080128621

Electron Beam Profile Measurement System and Method with Optional Faraday Cup
patent-application, May 2013

Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas
US Patent Application 13/723269; 20130134323
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130134323

Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001

Elmer, John W.; Teruya, Alan T.
US Patent Document 6,300,755
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6300755

Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013

Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas
US Patent Document 8,530,851
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8530851

Fast faraday cup with high bandwidth
patent-application, September 2005

Deibela, Craig E.
US Patent Application 10/810088; 20050212503
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050212503

Apparatus for ion beam fabrication
patent-application, November 2008

Tomimatsu, Satoshi; Shichi, Hiroyasu; Kaneoka, Noriyuki
US Patent Application 12/003207; 20080283778
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080283778

Stripline fast faraday cup for measuring GHz structure of ion beams
patent, April 1992

Bogaty, John M.
US Patent Document 5,103,161
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5103161

Method and apparatus for monitoring leakage current of a faraday cup
patent, October 2011

Berrian, Don; Fong, Steven
US Patent Document 8,040,124
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8040124

Miniature Modified Faraday Cup for Micro Electron Beams
patent-application, April 2008

Teruya, Alan T.; Elmer, John W.; Palmer, Todd A.
US Patent Application 11/166716; 20080088295
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080088295

Faraday cup assembly and method of controlling the same
patent-application, April 2007

Hwang, Sun-Ho
US Patent Application 11/544705; 20070080302
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070080302

Modified Faraday cup
patent, September 1996

Elmer, John W.; Teruya, Alan T.; O'Brien, Dennis
US Patent Document 5,554,926
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5554926

Faraday cup
patent, August 1986

Hayafuji, Yoshinori
US Patent Document 4,608,493
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4608493

System and Method for Ion Implantation with Improved Productivity and Uniformity
patent-application, December 2010

Vanderberg, Bo H.; Hayes, Steven C,; Ray, Andy
US Patent Application 12/796215; 20100308215
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100308215

Fast Faraday cup with high bandwidth
patent, March 2006

Deibele, Craig E.
US Patent Document 7,012,419
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7012419

Faraday cup array integrated with a readout IC and method for manufacture thereof
patent, October 2014

Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
US Patent Document 8,866,080
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8866080

High density faraday cup array or other open trench structures and method of manufacture thereof
patent, October 2014

Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
US Patent Document 8,866,081
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8866081

Integrated optical element and Faraday cup
patent, January 2013

Knuffman, Brenton J.; Steele, Adam V.; McClelland, Jabez J.
US Patent Document 8,350,556
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8350556

Electron beam diagnostic for profiling high power beams
patent-application, December 2005

Elmer, John W.; Palmer, Todd A.; Teruya, Alan T.
US Patent Application 11/159978; 20050285047
URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050285047

Similar Records in DOE Patents and OSTI.GOV collections:

Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Patent Sun, Ding; Shemyakin, Alexander

A Fast Faraday Cup includes a group of electrodes including a grounded electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the grounded electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cupmore » « less
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Stripline fast faraday cup for measuring GHz structure of ion beams

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The Stripline Fast Faraday Cup is a device which is used to quantitatively and qualitatively measure gigahertz time structure characteristics of ion beams with energies up to at least 30 Mev per nucleon. A stripline geometry is employed in conjunction with an electrostatic screen and a Faraday cup to provide for analysis of the structural characteristics of an ion beam. The stripline geometry allows for a large reduction in the size of the instrument while the electrostatic screen permits measurements of the properties associated with low speed ion beams.
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Similar Records

Title: Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Abstract

Citation Formats

Use of ion induced luminescence (IIL) as feedback control for ion implantation patent-application, June 2008

Electron Beam Profile Measurement System and Method with Optional Faraday Cup patent-application, May 2013

Enhanced modified faraday cup for determination of power density distribution of electron beams patent, October 2001

Electron beam profile measurement system and method with optional Faraday cup patent, September 2013

Fast faraday cup with high bandwidth patent-application, September 2005

Apparatus for ion beam fabrication patent-application, November 2008

Stripline fast faraday cup for measuring GHz structure of ion beams patent, April 1992

Method and apparatus for monitoring leakage current of a faraday cup patent, October 2011

Miniature Modified Faraday Cup for Micro Electron Beams patent-application, April 2008

Faraday cup assembly and method of controlling the same patent-application, April 2007

Modified Faraday cup patent, September 1996

Faraday cup patent, August 1986

System and Method for Ion Implantation with Improved Productivity and Uniformity patent-application, December 2010

Fast Faraday cup with high bandwidth patent, March 2006

Faraday cup array integrated with a readout IC and method for manufacture thereof patent, October 2014

High density faraday cup array or other open trench structures and method of manufacture thereof patent, October 2014

Integrated optical element and Faraday cup patent, January 2013

Electron beam diagnostic for profiling high power beams patent-application, December 2005

Use of ion induced luminescence (IIL) as feedback control for ion implantation
patent-application, June 2008

Electron Beam Profile Measurement System and Method with Optional Faraday Cup
patent-application, May 2013

Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001

Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013

Fast faraday cup with high bandwidth
patent-application, September 2005

Apparatus for ion beam fabrication
patent-application, November 2008

Stripline fast faraday cup for measuring GHz structure of ion beams
patent, April 1992

Method and apparatus for monitoring leakage current of a faraday cup
patent, October 2011

Miniature Modified Faraday Cup for Micro Electron Beams
patent-application, April 2008

Faraday cup assembly and method of controlling the same
patent-application, April 2007

Modified Faraday cup
patent, September 1996

Faraday cup
patent, August 1986

System and Method for Ion Implantation with Improved Productivity and Uniformity
patent-application, December 2010

Fast Faraday cup with high bandwidth
patent, March 2006

Faraday cup array integrated with a readout IC and method for manufacture thereof
patent, October 2014

High density faraday cup array or other open trench structures and method of manufacture thereof
patent, October 2014

Integrated optical element and Faraday cup
patent, January 2013

Electron beam diagnostic for profiling high power beams
patent-application, December 2005