Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams
Abstract
A Fast Faraday cup includes a group of electrodes including a ground electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the ground electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.
- Inventors:
- Issue Date:
- Research Org.:
- Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1805497
- Patent Number(s):
- 10914766
- Application Number:
- 16/101,982
- Assignee:
- Fermi Research Alliance, LLC (Batavia, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
- DOE Contract Number:
- AC02-07CH11359
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 08/13/2018
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Sun, Ding, and Shemyakin, Alexander. Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams. United States: N. p., 2021.
Web.
Sun, Ding, & Shemyakin, Alexander. Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams. United States.
Sun, Ding, and Shemyakin, Alexander. Tue .
"Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams". United States. https://www.osti.gov/servlets/purl/1805497.
@article{osti_1805497,
title = {Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams},
author = {Sun, Ding and Shemyakin, Alexander},
abstractNote = {A Fast Faraday cup includes a group of electrodes including a ground electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the ground electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2021},
month = {2}
}
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Works referenced in this record:
Use of ion induced luminescence (IIL) as feedback control for ion implantation
patent-application, June 2008
- Berry, Ivan L.
- US Patent Application 11/633694; 20080128621
Electron Beam Profile Measurement System and Method with Optional Faraday Cup
patent-application, May 2013
- Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas
- US Patent Application 13/723269; 20130134323
Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001
- Elmer, John W.; Teruya, Alan T.
- US Patent Document 6,300,755
Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013
- Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas
- US Patent Document 8,530,851
Fast faraday cup with high bandwidth
patent-application, September 2005
- Deibela, Craig E.
- US Patent Application 10/810088; 20050212503
Apparatus for ion beam fabrication
patent-application, November 2008
- Tomimatsu, Satoshi; Shichi, Hiroyasu; Kaneoka, Noriyuki
- US Patent Application 12/003207; 20080283778
Stripline fast faraday cup for measuring GHz structure of ion beams
patent, April 1992
- Bogaty, John M.
- US Patent Document 5,103,161
Method and apparatus for monitoring leakage current of a faraday cup
patent, October 2011
- Berrian, Don; Fong, Steven
- US Patent Document 8,040,124
Miniature Modified Faraday Cup for Micro Electron Beams
patent-application, April 2008
- Teruya, Alan T.; Elmer, John W.; Palmer, Todd A.
- US Patent Application 11/166716; 20080088295
Faraday cup assembly and method of controlling the same
patent-application, April 2007
- Hwang, Sun-Ho
- US Patent Application 11/544705; 20070080302
Modified Faraday cup
patent, September 1996
- Elmer, John W.; Teruya, Alan T.; O'Brien, Dennis
- US Patent Document 5,554,926
System and Method for Ion Implantation with Improved Productivity and Uniformity
patent-application, December 2010
- Vanderberg, Bo H.; Hayes, Steven C,; Ray, Andy
- US Patent Application 12/796215; 20100308215
Fast Faraday cup with high bandwidth
patent, March 2006
- Deibele, Craig E.
- US Patent Document 7,012,419
Faraday cup array integrated with a readout IC and method for manufacture thereof
patent, October 2014
- Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
- US Patent Document 8,866,080
High density faraday cup array or other open trench structures and method of manufacture thereof
patent, October 2014
- Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
- US Patent Document 8,866,081
Integrated optical element and Faraday cup
patent, January 2013
- Knuffman, Brenton J.; Steele, Adam V.; McClelland, Jabez J.
- US Patent Document 8,350,556
Electron beam diagnostic for profiling high power beams
patent-application, December 2005
- Elmer, John W.; Palmer, Todd A.; Teruya, Alan T.
- US Patent Application 11/159978; 20050285047