Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Sun, Ding; Shemyakin, Alexander

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Title: Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Abstract

A Fast Faraday Cup includes a group of electrodes including a grounded electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the grounded electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.

Inventors:: Sun, Ding; Shemyakin, Alexander

Issue Date:: Tue Apr 18 00:00:00 EDT 2023

Research Org.:: Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1998310

Patent Number(s):: 11630132

Application Number:: 17/151,055

Assignee:: Fermi Research Alliance, LLC (Batavia, IL)

DOE Contract Number:: AC02-07CH11359

Resource Type:: Patent

Resource Relation:: Patent File Date: 01/15/2021

Country of Publication:: United States

Language:: English

Citation Formats


                    Sun, Ding, and Shemyakin, Alexander. Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams.  United States: N. p., 2023. 
        Web.

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                    Sun, Ding, & Shemyakin, Alexander. Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams.  United States.

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                    Sun, Ding, and Shemyakin, Alexander. Tue .  
        "Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams".  United States.  https://www.osti.gov/servlets/purl/1998310.

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@article{osti_1998310,

  title        = {Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams},

  author       = {Sun, Ding and Shemyakin, Alexander},

  abstractNote = {A Fast Faraday Cup includes a group of electrodes including a grounded electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the grounded electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Apr 18 00:00:00 EDT 2023},

  month        = {Tue Apr 18 00:00:00 EDT 2023}

}

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Works referenced in this record:

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Hayafuji, Yoshinori
US Patent Document 4,608,493
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Elmer, John W.; Teruya, Alan T.; O'Brien, Dennis
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Electron Beam Profile Measurement System and Method with Optional Faraday Cup
patent-application, May 2013

Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas
US Patent Application 13/723269; 20130134323
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Miniature Modified Faraday Cup for Micro Electron Beams
patent-application, April 2008

Teruya, Alan T.; Elmer, John W.; Palmer, Todd A.
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An improved design of Faraday cup detector to reduce the escape of secondary electrons in plasma focus device by COMSOL
journal, October 2011

Roshani, G. H.; Habibi, M.; Sohrabi, M.
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Design of a tapered stripline fast Faraday cup for measurements on heavy ion beams: problems and solutions
conference, January 1998

Marcellini, F.; Poggi, M.
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patent, April 1992

Bogaty, John M.
US Patent Document 5,103,161
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Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001

Elmer, John W.; Teruya, Alan T.
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Electron beam profile measurement system and method with optional Faraday cup
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Sefkow, A.; Davidson, R.; Efthimion, P.
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patent-application, September 2005

Deibela, Craig E.
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patent, January 2013

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patent, October 2014

Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
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Faraday cup array integrated with a readout IC and method for manufacture thereof
patent, October 2014

Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R.
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URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8866080

Electron beam diagnostic for profiling high power beams
patent-application, December 2005

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URL: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050285047

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Fast Faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

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A circuit card stripline Fast Faraday cup quantitatively measures the picosecond time structure of a charged particle beam. The stripline configuration maintains signal integrity, and stitching of the stripline increases the bandwidth. A calibration procedure ensures the measurement of the absolute charge and time structure of the charged particle beam.
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Similar Records

Title: Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Abstract

Citation Formats

Faraday cup patent, August 1986

Apparatus for ion beam fabrication patent-application, November 2008

Fast Faraday cup with high bandwidth patent, March 2006

Modified Faraday cup patent, September 1996

Beam imaging sensor and method for using same patent, January 2017

Electron Beam Profile Measurement System and Method with Optional Faraday Cup patent-application, May 2013

Miniature Modified Faraday Cup for Micro Electron Beams patent-application, April 2008

Use of ion induced luminescence (IIL) as feedback control for ion implantation patent-application, June 2008

Transducer Head System patent, June 1962

Faraday cup assembly and method of controlling the same patent-application, April 2007

An improved design of Faraday cup detector to reduce the escape of secondary electrons in plasma focus device by COMSOL journal, October 2011

Design of a tapered stripline fast Faraday cup for measurements on heavy ion beams: problems and solutions conference, January 1998

Stripline fast faraday cup for measuring GHz structure of ion beams patent, April 1992

Enhanced modified faraday cup for determination of power density distribution of electron beams patent, October 2001

Electron beam profile measurement system and method with optional Faraday cup patent, September 2013

Fast Faraday cup to measure neutralized drift compression in intense ion charge bunches journal, May 2006

Electron Discharge Devices Using Electron-Bombarded Semiconductors patent, May 1973

System and Method for Ion Implantation with Improved Productivity and Uniformity patent-application, December 2010

Fast faraday cup with high bandwidth patent-application, September 2005

Integrated optical element and Faraday cup patent, January 2013

High density faraday cup array or other open trench structures and method of manufacture thereof patent, October 2014

Faraday cup array integrated with a readout IC and method for manufacture thereof patent, October 2014

Electron beam diagnostic for profiling high power beams patent-application, December 2005

Faraday cup
patent, August 1986

Apparatus for ion beam fabrication
patent-application, November 2008

Fast Faraday cup with high bandwidth
patent, March 2006

Modified Faraday cup
patent, September 1996

Beam imaging sensor and method for using same
patent, January 2017

Electron Beam Profile Measurement System and Method with Optional Faraday Cup
patent-application, May 2013

Miniature Modified Faraday Cup for Micro Electron Beams
patent-application, April 2008

Use of ion induced luminescence (IIL) as feedback control for ion implantation
patent-application, June 2008

Transducer Head System
patent, June 1962

Faraday cup assembly and method of controlling the same
patent-application, April 2007

An improved design of Faraday cup detector to reduce the escape of secondary electrons in plasma focus device by COMSOL
journal, October 2011

Design of a tapered stripline fast Faraday cup for measurements on heavy ion beams: problems and solutions
conference, January 1998

Stripline fast faraday cup for measuring GHz structure of ion beams
patent, April 1992

Enhanced modified faraday cup for determination of power density distribution of electron beams
patent, October 2001

Electron beam profile measurement system and method with optional Faraday cup
patent, September 2013

Fast Faraday cup to measure neutralized drift compression in intense ion charge bunches
journal, May 2006

Electron Discharge Devices Using Electron-Bombarded Semiconductors
patent, May 1973

System and Method for Ion Implantation with Improved Productivity and Uniformity
patent-application, December 2010

Fast faraday cup with high bandwidth
patent-application, September 2005

Integrated optical element and Faraday cup
patent, January 2013

High density faraday cup array or other open trench structures and method of manufacture thereof
patent, October 2014

Faraday cup array integrated with a readout IC and method for manufacture thereof
patent, October 2014

Electron beam diagnostic for profiling high power beams
patent-application, December 2005