Continuous time-of-flight ion mass spectrometer
Abstract
A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.
- Inventors:
- Issue Date:
- Research Org.:
- Univ. of California, Oakland, CA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1175089
- Patent Number(s):
- 6806467
- Application Number:
- 10/625,935
- Assignee:
- The Regents of the University of California (Los Alamos, NM)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-7405-ENG-36
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 74 ATOMIC AND MOLECULAR PHYSICS
Citation Formats
Funsten, Herbert O., and Feldman, William C. Continuous time-of-flight ion mass spectrometer. United States: N. p., 2004.
Web.
Funsten, Herbert O., & Feldman, William C. Continuous time-of-flight ion mass spectrometer. United States.
Funsten, Herbert O., and Feldman, William C. Tue .
"Continuous time-of-flight ion mass spectrometer". United States. https://www.osti.gov/servlets/purl/1175089.
@article{osti_1175089,
title = {Continuous time-of-flight ion mass spectrometer},
author = {Funsten, Herbert O. and Feldman, William C.},
abstractNote = {A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Oct 19 00:00:00 EDT 2004},
month = {Tue Oct 19 00:00:00 EDT 2004}
}
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