Combined distance-of-flight and time-of-flight mass spectrometer
Abstract
A combined distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS) instrument includes an ion source configured to produce ions having varying mass-to-charge ratios, a first detector configured to determine when each of the ions travels a predetermined distance, a second detector configured to determine how far each of the ions travels in a predetermined time, and a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.
- Inventors:
- Issue Date:
- Research Org.:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1119685
- Patent Number(s):
- 8648295
- Application Number:
- 13/695,675
- Assignee:
- RLO
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL B01D - SEPARATION
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- AC05-76RL01830; FG02-98ER14890
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Enke, Christie G, Ray, Steven J, Graham, Alexander W, Hieftje, Gary M, Barinaga, Charles J, and Koppenaal, David W. Combined distance-of-flight and time-of-flight mass spectrometer. United States: N. p., 2014.
Web.
Enke, Christie G, Ray, Steven J, Graham, Alexander W, Hieftje, Gary M, Barinaga, Charles J, & Koppenaal, David W. Combined distance-of-flight and time-of-flight mass spectrometer. United States.
Enke, Christie G, Ray, Steven J, Graham, Alexander W, Hieftje, Gary M, Barinaga, Charles J, and Koppenaal, David W. Tue .
"Combined distance-of-flight and time-of-flight mass spectrometer". United States. https://www.osti.gov/servlets/purl/1119685.
@article{osti_1119685,
title = {Combined distance-of-flight and time-of-flight mass spectrometer},
author = {Enke, Christie G and Ray, Steven J and Graham, Alexander W and Hieftje, Gary M and Barinaga, Charles J and Koppenaal, David W},
abstractNote = {A combined distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS) instrument includes an ion source configured to produce ions having varying mass-to-charge ratios, a first detector configured to determine when each of the ions travels a predetermined distance, a second detector configured to determine how far each of the ions travels in a predetermined time, and a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2014},
month = {2}
}
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Works referencing / citing this record:
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295
Combined distance-of-flight and time-of-flight mass spectrometer
patent, February 2014
- Enke, Christie G.; Ray, Steven J.; Graham, Alexander W.
- US Patent Document 8,648,295