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Title: Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements

Abstract

An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.

Inventors:
; ; ; ; ; ;
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1133818
Patent Number(s):
8752211
Application Number:
13/566,327
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING

Citation Formats

Kalinin, Sergei V., Balke, Nina, Borisevich, Albina Y., Jesse, Stephen, Maksymovych, Petro, Kim, Yunseok, and Strelcov, Evgheni. Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements. United States: N. p., 2014. Web.
Kalinin, Sergei V., Balke, Nina, Borisevich, Albina Y., Jesse, Stephen, Maksymovych, Petro, Kim, Yunseok, & Strelcov, Evgheni. Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements. United States.
Kalinin, Sergei V., Balke, Nina, Borisevich, Albina Y., Jesse, Stephen, Maksymovych, Petro, Kim, Yunseok, and Strelcov, Evgheni. Tue . "Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements". United States. https://www.osti.gov/servlets/purl/1133818.
@article{osti_1133818,
title = {Real space mapping of oxygen vacancy diffusion and electrochemical transformations by hysteretic current reversal curve measurements},
author = {Kalinin, Sergei V. and Balke, Nina and Borisevich, Albina Y. and Jesse, Stephen and Maksymovych, Petro and Kim, Yunseok and Strelcov, Evgheni},
abstractNote = {An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 10 00:00:00 EDT 2014},
month = {Tue Jun 10 00:00:00 EDT 2014}
}

Works referenced in this record:

Parametric resonance in microelectromechanical structures
patent, December 2002


Scanning probe microscope and scanning method
patent-application, March 2005


Scanning probe microscopy apparatus and techniques
patent-application, December 2005


Topography and recognition imaging atomic force microscope and method of operation
patent-application, January 2006


Drive head and personal atomic force microscope having the same
patent-application, June 2006


Electric potential difference detection method and scanning probe microscope
patent-application, March 2008


Method for Determining a Dopant Concentration in a Semiconductor Sample
patent-application, April 2009


Chemical Sensor with Oscillating Cantilevered Probe
patent-application, September 2009


Atomic Force Microscope
patent-application, January 2010


Near Field Scanning Measurement-Alternating Current Scanning Electrochemical Microscopy Devices and Methods of Use Thereof
patent-application, May 2010


Dynamic Mode Nan-Scale Imaging and Position Control Using Deflection Signal Direct Sampling of Higher Mode-Actuated Microcantilevers
patent-application, December 2011


Micromagnetic modeling of first-order reversal curve (FORC) diagrams for single-domain and pseudo-single-domain magnetite
journal, August 2003


Mapping Irreversible Electrochemical Processes on the Nanoscale: Ionic Phenomena in Li Ion Conductive Glass Ceramics
journal, October 2011


Mechanisms, Kinetics, and Dynamics of Oxidation and Reactions on Oxide Surfaces Investigated by Scanning Probe Microscopy
journal, April 2010


Atomic force microscopy as a tool for atom manipulation
journal, December 2009


Electrically Driven Redox Process in Cerium Oxides
journal, March 2010