Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Fink, Samuel D; Fondeur, Fernando F

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Title: Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Abstract

An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

Inventors:

Fink, Samuel D ^[1]; Fondeur, Fernando F ^[2]

Aiken, SC
North Augusta, SC

Issue Date:: Tue Oct 18 00:00:00 EDT 2011

Research Org.:: Westinghouse Savannah River

Sponsoring Org.:: USDOE

OSTI Identifier:: 1028793

Patent Number(s):: 8037945

Application Number:: 12/082,572

Assignee:: Savannah River Nuclear Solutions, LLC (Aiken, SC)

Patent Classifications (CPCs):: B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT

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B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
B82Y35/00 - Methods or apparatus for measurement or analysis of nanostructures

G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G01J3/44 - Raman spectrometry

G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2021/3595 - {using FTIR}
G01N21/3563 - for analysing solids
G01N21/65 - Raman scattering

G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
G01Q30/02 - Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope

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DOE Contract Number:: AC09-96-SR18500

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats


                    Fink, Samuel D, and Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer.  United States: N. p., 2011. 
        Web.

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                    Fink, Samuel D, & Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer.  United States.

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                    Fink, Samuel D, and Fondeur, Fernando F. Tue .  
        "Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer".  United States.  https://www.osti.gov/servlets/purl/1028793.

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@article{osti_1028793,

  title        = {Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer},

  author       = {Fink, Samuel D and Fondeur, Fernando F},

  abstractNote = {An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {Tue Oct 18 00:00:00 EDT 2011},

  month        = {Tue Oct 18 00:00:00 EDT 2011}

}

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Works referenced in this record:

Vibrational-infrared near-field microscopy
journal, July 2002

Keilmann, Fritz
Vibrational Spectroscopy, Vol. 29, Issue 1-2
https://doi.org/10.1016/S0924-2031(01)00195-3

Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes
journal, June 2003

Anderson, Mark S.; Gaimari, Stephen D.
Journal of Structural Biology, Vol. 142, Issue 3
https://doi.org/10.1016/S1047-8477(03)00026-1

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Similar Records

Title: Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Abstract

Citation Formats

Vibrational-infrared near-field microscopy journal, July 2002

Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes journal, June 2003

Vibrational-infrared near-field microscopy
journal, July 2002

Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes
journal, June 2003