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Title: Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Abstract

An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

Inventors:
 [1];  [2]
  1. Aiken, SC
  2. North Augusta, SC
Issue Date:
Research Org.:
Westinghouse Savannah River
Sponsoring Org.:
USDOE
OSTI Identifier:
1028793
Patent Number(s):
8037945
Application Number:
12/082,572
Assignee:
Savannah River Nuclear Solutions, LLC (Aiken, SC)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
DOE Contract Number:  
AC09-96-SR18500
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Fink, Samuel D, and Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer. United States: N. p., 2011. Web.
Fink, Samuel D, & Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer. United States.
Fink, Samuel D, and Fondeur, Fernando F. Tue . "Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer". United States. https://www.osti.gov/servlets/purl/1028793.
@article{osti_1028793,
title = {Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer},
author = {Fink, Samuel D and Fondeur, Fernando F},
abstractNote = {An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {10}
}

Works referenced in this record:

Vibrational-infrared near-field microscopy
journal, July 2002


Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes
journal, June 2003