Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer
Abstract
An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.
- Inventors:
-
- Aiken, SC
- North Augusta, SC
- Issue Date:
- Research Org.:
- Westinghouse Savannah River
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1028793
- Patent Number(s):
- 8037945
- Application Number:
- 12/082,572
- Assignee:
- Savannah River Nuclear Solutions, LLC (Aiken, SC)
- Patent Classifications (CPCs):
-
B - PERFORMING OPERATIONS B82 - NANOTECHNOLOGY B82Y - SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
- DOE Contract Number:
- AC09-96-SR18500
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
Citation Formats
Fink, Samuel D, and Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer. United States: N. p., 2011.
Web.
Fink, Samuel D, & Fondeur, Fernando F. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer. United States.
Fink, Samuel D, and Fondeur, Fernando F. Tue .
"Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer". United States. https://www.osti.gov/servlets/purl/1028793.
@article{osti_1028793,
title = {Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer},
author = {Fink, Samuel D and Fondeur, Fernando F},
abstractNote = {An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2011},
month = {10}
}
Works referenced in this record:
Vibrational-infrared near-field microscopy
journal, July 2002
- Keilmann, Fritz
- Vibrational Spectroscopy, Vol. 29, Issue 1-2
Raman-atomic force microscopy of the ommatidial surfaces of Dipteran compound eyes
journal, June 2003
- Anderson, Mark S.; Gaimari, Stephen D.
- Journal of Structural Biology, Vol. 142, Issue 3