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Title: Sensing mode atomic force microscope

Abstract

An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.

Inventors:
 [1];  [2]
  1. (Port Jefferson, NY)
  2. (Upton, NY)
Issue Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY
OSTI Identifier:
875043
Patent Number(s):
6518570
Assignee:
Brookhaven Science Associates (Upton, NY) BNL
DOE Contract Number:  
AC02-98CH10886
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
sensing; mode; atomic; force; microscope; utilizes; pulse; release; improved; method; operation; minimize; contact; forces; probe; tip; affixed; flexible; cantilever; specimen; measured; magnetic; particle; proximate; electromagnetic; coil; energized; generates; field; applies; driving; sufficient; overcome; adhesive; exhibited; independently; displaceable; piezo; elements; operable; z-axis; controller; drives; element; provide; controlled; approach; withdraw; activates; withdrawal; following; adjusts; height; maintain; substantially; constant; distance; successive; samples; magnetic field; substantially constant; force microscope; atomic force; /250/73/

Citation Formats

Hough, Paul V. C., and Wang, Chengpu. Sensing mode atomic force microscope. United States: N. p., 2003. Web.
Hough, Paul V. C., & Wang, Chengpu. Sensing mode atomic force microscope. United States.
Hough, Paul V. C., and Wang, Chengpu. Wed . "Sensing mode atomic force microscope". United States. https://www.osti.gov/servlets/purl/875043.
@article{osti_875043,
title = {Sensing mode atomic force microscope},
author = {Hough, Paul V. C. and Wang, Chengpu},
abstractNote = {An atomic force microscope utilizes a pulse release system and improved method of operation to minimize contact forces between a probe tip affixed to a flexible cantilever and a specimen being measured. The pulse release system includes a magnetic particle affixed proximate the probe tip and an electromagnetic coil. When energized, the electromagnetic coil generates a magnetic field which applies a driving force on the magnetic particle sufficient to overcome adhesive forces exhibited between the probe tip and specimen. The atomic force microscope includes two independently displaceable piezo elements operable along a Z-axis. A controller drives the first Z-axis piezo element to provide a controlled approach between the probe tip and specimen up to a point of contact between the probe tip and specimen. The controller then drives the first Z-axis piezo element to withdraw the cantilever from the specimen. The controller also activates the pulse release system which drives the probe tip away from the specimen during withdrawal. Following withdrawal, the controller adjusts the height of the second Z-axis piezo element to maintain a substantially constant approach distance between successive samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {1}
}

Patent:

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