skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Hyperbaric hydrothermal atomic force microscope

Abstract

A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.

Inventors:
 [1];  [2];  [3];  [3]
  1. Livermore, CA
  2. Milpitas, CA
  3. Laramie, WY
Issue Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
OSTI Identifier:
874670
Patent Number(s):
6437328
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
hyperbaric; hydrothermal; atomic; force; microscope; afm; provided; image; solid; surfaces; fluids; liquid; gas; pressures; normal; atmospheric; pressure; sample; heated; surface; imaged; aqueous; solution; temperatures; 100degree; nm; vertical; resolution; pressurized; base; chamber; houses; stepper; motor; piezoelectric; scanner; chemically; inert; flexible; membrane; separates; cell; environment; constrains; temperature; allowing; movement; designed; continuous; flow; aqueous solution; atmospheric pressure; stepper motor; solid surface; force microscope; atomic force; /250/

Citation Formats

Knauss, Kevin G, Boro, Carl O, Higgins, Steven R, and Eggleston, Carrick M. Hyperbaric hydrothermal atomic force microscope. United States: N. p., 2002. Web.
Knauss, Kevin G, Boro, Carl O, Higgins, Steven R, & Eggleston, Carrick M. Hyperbaric hydrothermal atomic force microscope. United States.
Knauss, Kevin G, Boro, Carl O, Higgins, Steven R, and Eggleston, Carrick M. Tue . "Hyperbaric hydrothermal atomic force microscope". United States. https://www.osti.gov/servlets/purl/874670.
@article{osti_874670,
title = {Hyperbaric hydrothermal atomic force microscope},
author = {Knauss, Kevin G and Boro, Carl O and Higgins, Steven R and Eggleston, Carrick M},
abstractNote = {A hyperbaric hydrothermal atomic force microscope (AFM) is provided to image solid surfaces in fluids, either liquid or gas, at pressures greater than normal atmospheric pressure. The sample can be heated and its surface imaged in aqueous solution at temperatures greater than 100.degree. C. with less than 1 nm vertical resolution. A gas pressurized microscope base chamber houses the stepper motor and piezoelectric scanner. A chemically inert, flexible membrane separates this base chamber from the sample cell environment and constrains a high temperature, pressurized liquid or gas in the sample cell while allowing movement of the scanner. The sample cell is designed for continuous flow of liquid or gas through the sample environment.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2002},
month = {1}
}

Patent:

Save / Share:

Works referenced in this record:

Dissolution Kinetics of the Barium Sulfate (001) Surface by Hydrothermal Atomic Force Microscopy
journal, September 1998


An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy
journal, September 1998


Temperature controlled microstage for an atomic force microscope
journal, July 1996


A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 °C
journal, August 1998