Multimodal x-ray and electron microscopy of the Allende meteorite

Lo, Yuan Hung

doi:10.11577/1616404

Title: Multimodal x-ray and electron microscopy of the Allende meteorite

Dataset
Other Related Research

Abstract

Soft x-ray ptychography of Allende meteorite around Fe L3-edge (707 eV), Ni L2/3-edge (865/848 eV), Mg K-edge (1,302 eV), and Al K-edge (1,551 eV)

Authors:

Lo, Yuan Hung

CXIDB

Publication Date:: Thu Jun 20 00:00:00 EDT 2019

Other Number(s):: CXIDB ID 102

DOE Contract Number:: AC02-05CH11231

Research Org.:: Coherent X-ray Imaging Data Bank (Lawrence Berkeley National Laboratory); UCLA

Sponsoring Org.:: UCLA

Subject:: ALS; Allende meteorite; COSMIC; Ptychography; X-ray Free-electorn Lasers; XFEL

OSTI Identifier:: 1616404

DOI:: https://doi.org/10.11577/1616404

Citation Formats


                    Lo, Yuan Hung. Multimodal x-ray and electron microscopy of the Allende meteorite.  United States: N. p., 2019. 
        Web.  doi:10.11577/1616404.

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                    Lo, Yuan Hung. Multimodal x-ray and electron microscopy of the Allende meteorite.  United States.  doi:https://doi.org/10.11577/1616404

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                    Lo, Yuan Hung. 2019.  
"Multimodal x-ray and electron microscopy of the Allende meteorite".  United States.  doi:https://doi.org/10.11577/1616404.  https://www.osti.gov/servlets/purl/1616404. Pub date:Thu Jun 20 00:00:00 EDT 2019

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@article{osti_1616404,

  title        = {Multimodal x-ray and electron microscopy of the Allende meteorite},

  author       = {Lo, Yuan Hung},

  abstractNote = {Soft x-ray ptychography of Allende meteorite around Fe L3-edge (707 eV), Ni L2/3-edge (865/848 eV), Mg K-edge (1,302 eV), and Al K-edge (1,551 eV)},

  doi          = {10.11577/1616404},

  journal      = {},

  number       = ,

  volume       = ,

  place        = {United States},

  year         = {Thu Jun 20 00:00:00 EDT 2019},

  month        = {Thu Jun 20 00:00:00 EDT 2019}

}

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DOI: https://doi.org/10.11577/1616404

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Multimodal x-ray and electron microscopy of the Allende meteorite

Journal Article Lo, Yuan Hung ; Liao, Chen-Ting ; Zhou, Jihan ; ... - Science Advances

Multimodal microscopy that combines complementary nanoscale imaging techniques is critical for extracting comprehensive chemical, structural, and functional information, particularly for heterogeneous samples. X-ray microscopy can achieve high-resolution imaging of bulk materials with chemical, magnetic, electronic, and bond orientation contrast, while electron microscopy provides atomic-scale spatial resolution with quantitative elemental composition. In this work, we combine x-ray ptychography and scanning transmission x-ray spectromicroscopy with three-dimensional energy-dispersive spectroscopy and electron tomography to perform structural and chemical mapping of an Allende meteorite particle with 15-nm spatial resolution. Furthermore, we use textural and quantitative elemental information to infer the mineral composition and discuss potentialmore »« less
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