High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6)

Nelson, Johanna

doi:10.11577/1096908

Title: High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6)

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Abstract

This is the third of five exposures of the same sample at different tilts. This one is at +30 degrees tilt. Check CXI IDs 4 to 8 for the complete set.

Authors:: Nelson, Johanna

Publication Date:: 2011-07-22

Other Number(s):: CXIDB ID 6

DOE Contract Number:: AC02-05CH11231

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Coherent X-ray Imaging Data Bank; Stony Brook Univ., NY (United States); Northwestern Univ., Evanston, IL (United States); Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)

Keywords:: Gold labeled frozen dried Saccharomyces cerevisiae yeast cells; XFEL; Single Particle X-ray Diffraction Imaging; X-ray Free-electorn Lasers; 9.0.1; ALS

OSTI Identifier:: 1096908

DOI:: https://doi.org/10.11577/1096908

Citation Formats


                    Nelson, Johanna. High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6).  United States: N. p., 2011. 
        Web.  doi:10.11577/1096908.

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                    Nelson, Johanna. High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6).  United States.  doi:https://doi.org/10.11577/1096908

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                    Nelson, Johanna. 2011.  
"High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6)".  United States.  doi:https://doi.org/10.11577/1096908.  https://www.osti.gov/servlets/purl/1096908. Pub date:Fri Jul 22 00:00:00 EDT 2011

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@article{osti_1096908,

  title        = {High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 6)},

  author       = {Nelson, Johanna},

  abstractNote = {This is the third of five exposures of the same sample at different tilts. This one is at +30 degrees tilt. Check CXI IDs 4 to 8 for the complete set.},

  doi          = {10.11577/1096908},

  journal      = {},

  number       = ,

  volume       = ,

  place        = {United States},

  year         = {2011},

  month        = {7}

}

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DOI: https://doi.org/10.11577/1096908

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High-resolution x-ray diffraction microscopy of specifically labeled yeast cells (CXIDB ID 7)

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This is the fourth of five exposures of the same sample at different tilts. This one is at -15 degrees tilt. Check CXI IDs 4 to 8 for the complete set.
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