Applications of synchrotron radiation techniques to materials science II

Conference · Fri Sep 01 00:00:00 EDT 1995

OSTI ID:99476

Terminello, L J ^[1]; Shinn, N D ^[2]; Ice, G E ^[3]; D`Amico, K L ^[4]; Perry, D L ^[5]

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1. ed.; Lawrence Livermore National Lab., CA (United States)
2. ed.; Sandia National Labs., Albuquerque, NM (United States)
3. ed.; Oak Ridge National Lab., TN (United States)
4. ed.; X-ray Analytics, Ltd., Hinsdale, IL (United States)
5. ed.; Lawrence Berkeley Lab., CA (United States)

The purpose of this symposium was to bring together the materials science community and the characterization techniques that use synchrotron radiation. The focus was the characterization of reduced dimensional systems. Several of the topics covered in this proceedings include surfaces, interfaces, polymers, glasses, thin films, magnetic materials, metal systems, multilayers, and electronic materials -- to name a few. Many new areas of research were also presented and indicate a growth of the community into areas that are more tightly coupled to applied research. Separate abstracts were prepared for 39 pages in this book.

• OSTI ID: 99476
• Report Number(s): CONF-941144--; ISBN 1-55899-277-4
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
CHEMICAL COMPOSITION
COMPOSITE MATERIALS
CRYSTAL DEFECTS
DIAGNOSTIC TECHNIQUES
LEADING ABSTRACT
MATERIALS
MEETINGS
MICROSTRUCTURE
PHASE STUDIES
RESEARCH PROGRAMS
SEMICONDUCTOR MATERIALS
SYNCHROTRON RADIATION
USES