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U.S. Department of Energy
Office of Scientific and Technical Information

Critical thickness measurements in vapor-deposited Pentaerythritol Tetranitrate (PETN) films.

Conference ·
OSTI ID:992778

Abstract Not Provided

Research Organization:
Sandia National Laboratories
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
992778
Report Number(s):
SAND2010-2216C
Country of Publication:
United States
Language:
English

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