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Critical thickness measurements in vapor-deposited Pentaerythritol Tetranitrate (PETN) films.

Conference ·
OSTI ID:983669
; ; ; ; ;

No abstract prepared.

Research Organization:
Sandia National Laboratories
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
OSTI ID:
983669
Report Number(s):
SAND2010-1415C
Country of Publication:
United States
Language:
English

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Related Subjects

45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
99 GENERAL AND MISCELLANEOUS
EXPLOSIONS
PETN
THICKNESS