Test-to-Failure of Crystalline Silicon Modules: Preprint
Accelerated lifetime testing of five crystalline silicon module designs was carried out according to the Terrestrial Photovoltaic Module Accelerated Test-to-Failure Protocol. This protocol compares the reliability of various module constructions on a quantitative basis. The modules under test are subdivided into three accelerated lifetime testing paths: 85..deg..C/85% relative humidity withsystem bias, thermal cycling between 40..deg..C and 85..deg..C, and a path that alternates between damp heat and thermal cycling. The most severe stressor is damp heat with system bias applied to simulate the voltages that modules experience when connected in an array. Positive 600 V applied to the active layer with respect to the grounded module frame accelerates corrosion of the silver gridfingers and degrades the silicon nitride antireflective coating on the cells. Dark I-V curve fitting indicates increased series resistance and saturation current around the maximum power point; however, an improvement in junction recombination characteristics is obtained. Shunt paths and cell-metallization interface failures are seen developing in the silicon cells as determined byelectroluminescence, thermal imaging, and I-V curves in the case of negative 600 V bias applied to the active layer. Ability to withstand electrolytic corrosion, moisture ingress, and ion drift under system voltage bias are differentiated.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 991976
- Report Number(s):
- NREL/CP-5200-47755; TRN: US201021%%435
- Resource Relation:
- Conference: Presented at the 35th IEEE Photovoltaic Specialists Conference, 20-25 June 2010, Honolulu, Hawaii
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
BYPASSES
COATINGS
CORROSION
ELECTROCHEMICAL CORROSION
ELECTROLUMINESCENCE
FINGERS
HUMIDITY
ION DRIFT
LIFETIME
MOISTURE
RECOMBINATION
RELIABILITY
SATURATION
SILICON
SILICON NITRIDES
SILVER
TESTING
THERMAL CYCLING
photovoltaics (PV)
PV
modules
corrosion
electrolytic corrosion
leakage currents
test-to-failure
accelerated lifetime testing
ALT
crystalline silicon (x-Si) (c-Si)